High performance Stem has new electron optics
Hitachi High Technologies
By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens
Hitachi High-Technologies has announced the launch of the HD-2700 ultra-high resolution scanning transmission electron microscope (Stem).
This instrument is characterised by new electron optics which now includes a spherical aberration correction system (developed in collaboration with CEOS).
By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens.
The HD-2700 has applications in materials science, semiconductors and nanotechnology, both in research and development and quality control.
High speed, high sensitivity EDX analysis is possible since the HD-2700 can achieve exceptionally high probe current density (ten times greater probe current than other models in the HD-series).
This allows extremely rapid acquisition of elemental distribution images, even for elements at low concentration.
Electron energy loss spectrometry is also available for analysis with enhanced spatial resolution and even lower elemental detection limits.
Extremely versatile imaging allows simultaneous multiple-image acquisition and display, with a wide variety of combinations, including secondary electron/bright field, secondary electron/dark field, bright field/dark field, dark field/EDX and dark field/EELS.
A comprehensive digital image management system is also included.
The HD-2700 enjoys the same simplicity of operation as other models in the HD-series with a user interface that is as easy to use as that of an SEM enabling occasional users to produce results only dedicated specialists could achieve in alternative instruments.
The HD-2700 also has sample holders that are fully compatible with the FB-2100 focused ion beam system, ensuring seamless interchange between the instruments for sample preparation and imaging and analysis.
This also provides high sample-throughput so that the HD series can meet varied demands from state-of-the-art R+D to evaluation at the production line.
Hitachi has announced that it will be exhibiting its new-concept HT7700 digital TEM for the first time in the UK at EMAG, which will take place at Birmingham University om 6 - 9 September 2011.
Hitachi High Technologies has launched the SU8000 range of ultra-high-resolution field-emission scanning electron microscopes (FESEMs).
Hitachi High-Technologies has introduced a scanning electron microscope (SEM) for applications such as semiconductor devices, electronics, nanotechnology materials, life sciences and medicine.
The Zonesem desktop electron microscope (EM) sample cleaner from Hitachi High-Technologies is designed for cleaning and storing EM samples in readiness for high-quality imaging and analysis.
The SU8040 Field Emission Scanning Electron Microscope (FE-SEM) from Hitachi features a Regulus (Regulated Ultra Stable) Specimen Stage for smooth sample control at ultra-high magnification.