HT7700 allows analysis of light element materials
Hitachi High Technologies
Hitachi has announced that it will be exhibiting its new-concept HT7700 digital TEM for the first time in the UK at EMAG, which will take place at Birmingham University om 6 - 9 September 2011.
The HT7700 is a research-grade 120kV TEM that features fully integrated CCD cameras to complement the fully digital imaging system.
It is suited to imaging and the analysis of light element materials, and features Hitachi's dual focal-length objective lens.
Hitachi will also be previewing the latest advances in sample preparation with the new Zone Cleaner - a novel instrument for the gentle cleaning of even the most sensitive SEM and TEM specimens.
Using a UV/Ozone cleaning process to remove surface hydrocarbons from samples in a controllable fashion, higher contrast and resolution can be achieved, along with improved analytical data, according to the company.
Applications specialists from Europe and Japan will also be sharing the latest research data from Hitachi's HD2700 Cs-corrected STEM and SU9000 In-lens SEM/STEM during the lunchtime theatre sessions.
Hitachi High Technologies has launched the SU8000 range of ultra-high-resolution field-emission scanning electron microscopes (FESEMs).
Hitachi High-Technologies has introduced a scanning electron microscope (SEM) for applications such as semiconductor devices, electronics, nanotechnology materials, life sciences and medicine.
The Zonesem desktop electron microscope (EM) sample cleaner from Hitachi High-Technologies is designed for cleaning and storing EM samples in readiness for high-quality imaging and analysis.
The SU8040 Field Emission Scanning Electron Microscope (FE-SEM) from Hitachi features a Regulus (Regulated Ultra Stable) Specimen Stage for smooth sample control at ultra-high magnification.
Hitachi High Technologies has launched the HT7700 120kV transmission electron microscope designed for biomedical research and research and development (R+D) for pharmaceuticals and nanotechnology.