HT7700 allows analysis of light element materials
Hitachi High Technologies
HT7700
Hitachi has announced that it will be exhibiting its new-concept HT7700 digital TEM for the first time in the UK at EMAG, which will take place at Birmingham University om 6 - 9 September 2011.
The HT7700 is a research-grade 120kV TEM that features fully integrated CCD cameras to complement the fully digital imaging system.
It is suited to imaging and the analysis of light element materials, and features Hitachi's dual focal-length objective lens.
Hitachi will also be previewing the latest advances in sample preparation with the new Zone Cleaner - a novel instrument for the gentle cleaning of even the most sensitive SEM and TEM specimens.
Using a UV/Ozone cleaning process to remove surface hydrocarbons from samples in a controllable fashion, higher contrast and resolution can be achieved, along with improved analytical data, according to the company.
Applications specialists from Europe and Japan will also be sharing the latest research data from Hitachi's HD2700 Cs-corrected STEM and SU9000 In-lens SEM/STEM during the lunchtime theatre sessions.
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