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New methods in correlative microscopy are helping combine data from different imaging techniques.
FEI launches Helios NanoLab 450 F1 DualBeam
The DualBeam from FEI claims to deliver faster, more accurate answers for new processes and materials.
UniColore technology added to Versa 3D DualBeam
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Accessories improve DualBeam performance
Features enable improved yield of ultrathin sample preparation and control of gas-assisted milling.







