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FEI launches Tecnai Arctica for structural analysis
Tecnai Arctica makes advanced structural analysis available to a broader range of facilities and budgets.
A correlative microscopy solution for cell biologists
New methods in correlative microscopy are helping combine data from different imaging techniques.
FEI launches Helios NanoLab 450 F1 DualBeam
The DualBeam from FEI claims to deliver faster, more accurate answers for new processes and materials.
UniColore technology added to Versa 3D DualBeam
Versa 3D DualBeam offers an analytical mode, with beam currents up to100nA, and imaging with a resolution of 1.4nm.
Accessories improve DualBeam performance
Features enable improved yield of ultrathin sample preparation and control of gas-assisted milling.
