Russ Swan, Editor, writes:
We see from your search that you're looking for information on the term "Focused Ion Beam",
and we have a large number of manufacturers' news releases and technical articles here on Laboratorytalk which will be of interest.
Let me be your guide.
Start with
the news release Developing tools for single-atom imaging from
FEI, which we summarised at the time by saying "Ambitious research programme seeks to advance electron microscopes and focused ion beam systems (FIBs) so that the structure of materials can be made visible and processed at the single-atom
scale".
Several months prior to that,
we featured the news release Solving semiconductor industry's analytical needs from
SGS: "Besides its wide service portfolio, SGS Institut Fresenius focuses on some special techniques in order to correspond with developments in the semiconductor industry".
In January 2007, we covered the news from Hitachi High-Technologies
concerning its HD-2700
- take a look at High performance Stem has new electron optics
which says: "By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens".
Take a look also at the news release from FEI, FEI launches top-of-line research dualbeam at M+M,
as well as BASF chooses FEI system for nanoparticle R+D from FEI,
and TEM for high throughput comes to Europe from Hitachi High-Technologies.
See also:
TEM reaches 300kV in three minutes
(October 2003)
High performance tunelling electron microscope uses a single crystal LaB6 electron source and offers 0.102nm crystal lattice resolution and 0.18nm point to point resolution