Latest news on Laboratorytalk categorised by product type
Electron microscopy systems
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Hitachi expands its electron microscopy range
Hitachi High-Technologies is introducing two new additions to its rapidly expanding range of electron microscopes at Microscience 2008
News from Hitachi High-Technologies (24 April 2008)
FEI and Imago in atom probe collaboration
FEI and Imago Scientific Instruments announce a comprehensive collaboration on the distribution and marketing of Imago's Leap product line Brochure available
News from FEI (17 April 2008)
Titan recognised for technical excellence
FEI's Titan 80-300, the world's most powerful commercially-available microscope, was given an award for technical excellence in evaluation and measurement at Nano Tech 2008 in Tokyo, Japan Brochure available
News from FEI (25 March 2008)
Particle characterisation gives size and shape
FEI and Malvern Instruments have released Quanta Morphologi, combining the performance of FEI's Quanta FEG scanning electron microscope and Malvern's Morphologi particle characterisation software Brochure available
News from FEI ( 5 March 2008)
Nikon and Jeol launch NeoScope benchtop SEM
NeoScope, targeted at the bioscience research and industrial inspection communities, fills the optical microscopist's need for advanced imaging capability that is both affordable and easy to use.
News from Jeol USA ( 4 March 2008)
Tabletop microscope is kinder to the environment
Hitachi High-Technologies says its TM-1000 tabletop microscope is measurably kinder to the environment than the company's previous entry-level scanning electron microscope
News from Hitachi High-Technologies ( 3 March 2008)
Boeckeler to distribute Jeol sample prep tool
Boeckeler's RMC products division of Tucson, Arizona, a manufacturer of microtomes for sample preparation, will act as distributor for Jeol's unique sample preparation tool, the Cross Section Polisher
News from Jeol USA (25 February 2008)
Titan Krios opens eyes for structural biology
FEI has introduced what it says is a revolutionary, high-throughput, cryo transmission electron microscope (TEM) that combines high-throughput sample handling with state-of-the-art electron optics Brochure available
News from FEI ( 5 February 2008)
FEI has opened a Nanoport in Shanghai, China
FEI NanoPorts are located in key centres of technology excellence where there is a critical number of customers and partners to encourage the advancement of nanoscale development Brochure available
News from FEI (22 January 2008)
Technology in education of reintegrated scientist
User application article Boston College has selected the new Jeol MultiBeam focused ion beam system and a field emission scanning electron microscope for its nanofabrication clean room facility in Newton, Massachusetts
News from Jeol USA (18 January 2008)
Scanning electron microscope is 'portable'
The new CarryScope is described as the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene
News from Jeol USA ( 9 January 2008)
Developing tools for single-atom imaging
Technical background article Ambitious research programme seeks to advance electron microscopes and focused ion beam systems (FIBs) so that the structure of materials can be made visible and processed at the single-atom scale Brochure available
News from FEI (20 December 2007)
The electron microscope and the moon walker
Philadelphia's Central High School became the first in the USA to open deep inner space exploration to students with the arrival of a new Phenom table top scanning electron microscope Brochure available
News from FEI (21 November 2007)
First Titan S/Tem installed in Sweden
Chalmers University of Technology is the first institute in Sweden to instal an FEI Titan scanning/transmission election microscope (S/Tem), the world's most powerful commercially-available microscope Brochure available
News from FEI (19 November 2007)
Tabletop microscope performs chemical analysis
The latest development for the highly successful TM-1000 tabletop microscope from Hitachi is the addition of chemical microanalysis by EDX, to create an even more powerful investigation technique
News from Hitachi High-Technologies (14 November 2007)
Titan electron microscope raised to a power
Known as the 'Titan cubed' because of its fully enclosed profile, it is designed to deliver the highest stability and performance in a commercial scanning/transmission electron microscope (S/TEM) Brochure available
News from FEI (22 October 2007)
Electron microscopes score three hits at USC
User application article University of Southern California (USC) has purchased three electron microscopes from Jeol USA for its new Center of Excellence for Nano-Imaging in Los Angeles, California
News from Jeol USA ( 5 October 2007)
Smallest details ever seen by electron microscopy
Technical background article A microscopy breakthrough for the Team project as details as small as 0.5angstrom (0.05nanometre) are resolved in scanning transmission electron microscope (STEM) mode Brochure available
News from FEI (11 September 2007)
ISS distributes Tescan SEM systems in UK, Ireland
Tescan, a European manufacturer of scanning electron microscopes, has appointed ISS as its distributor for the UK and Ireland
News from ISS (31 August 2007)
New CLUE upgrade for SEMs is revealed
The Optical Spectroscopy Division of Horiba Jobin Yvon has introduced a new Cathodoluminescence Universal Extension (CLUE) upgrade for Scanning Electron Microscopes (SEMs)
News from Horiba Jobin Yvon (17 August 2007)
Silicon drift detectors offer low energy benefits
Thermo Fisher Scientific has unveiled a new and improved large-area UltraDry silicon drift detector for electron microscopes
News from Thermo Fisher Scientific (Microanalysis) ( 9 August 2007)
New high-sensitivity NMR spectrometer goes on show
JEOL USA is introducing its new compact, high-performance ECS-400 400MHz NMR spectrometer featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet
News from Jeol USA ( 9 August 2007)
New SEM offers ultra-high resolution imaging
FEI has introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM 30 series Brochure available
News from FEI ( 7 August 2007)
'Super microprobe' installation completed at Nist
User application article Jeol JXA-8500F is a unique type of electron microscope with analytical ability said to surpass that of even the most advanced scanning electron microscopes (SEM) available today
News from Jeol USA ( 6 August 2007)
Video games teach nanotechnology to inspire youth
As a sponsor of two modules (NanoScaling and NanoImaging) in the new NanoMission series of video games, FEI hopes to inspire young gamers as they adventure into the world of the nanoscale Brochure available
News from FEI ( 2 August 2007)
RMC family of microtomes for sample preparation
AFM-990 precision motorised microtome has been designed for users of all microscopy techniques: optical, scanning electron and scanning probe systems
News from ISS (26 July 2007)
Next generation cryo sample preparation tool
Vitrobot Mark IV is an easy-to-use system that features a newly-designed touchscreen user interface operated under Linux, and robotics that ensures high-quality, reproducible freezing of samples Brochure available
News from FEI (16 July 2007)
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