Electron microscopy systems
(a sub category of Analytical instruments)
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Latest articles from 'Electron microscopy systems'
News releases from this sub-category
Showing 1-25 of 211 articles
ISS - latest company news
1 July 2009 - ISS has announced that its customer CMA is now a central services facility providing imaging and analysis services and facilities to third-level, research and private sectors.
News from ISS, Jul 2, 2009
Natural History Museum selects Asylum Research AFM
The Natural History Museum in London has announced that its mineralogy department has acquired Asylum Research's MFP-3D stand-alone atomic force microscope (AFM) to study nanomaterials.
News from Asylum Research, Jul 1, 2009
Asylum offers Ztherm local thermal-analysis option
Asylum Research, a specialist in scanning probe and atomic force microscopy (SPM/AFM), has unveiled the Ztherm modulated local thermal analysis option for its MFP-3D and Cypher AFMs.
News from Asylum Research, Jun 18, 2009
FEI - latest company news
17 June 2009 - FEI, a provider of atomic-scale imaging and analysis systems, has acquired the Mineral Liberation Analysis business of JKTech Pty.
News from FEI, Jun 18, 2009
Asylum Research - latest company news
15 June 2009 - Asylum Research has appointed Dr Mick Phillips as applications scientist for Asylum Research UK.
News from Asylum Research, Jun 16, 2009
EMS offers high-precision tissue slicers
Electron Microscopy Sciences has added the EMS7000smz and EMS5000mz high- precision vibrating microtomes to its product line for microscopy and histology.
News from Electron Microscopy Sciences, Jun 9, 2009
Hitachi High-Technologies - latest company news
8 June 2009 - Hitachi High-Technologies is celebrating 50 years of supply of Hitachi electron microscopes into Europe.
News from Hitachi High-Technologies, Jun 9, 2009
FEI offers remote assistant for Phenom SEM
FEI has announced the Phenom Remote Assistant, a service enhancement that allows remote tracking, diagnostics and repair of Phenom personal scanning electron microscope (SEM) systems.
News from FEI, Jun 9, 2009
Jeol JSM-7600F e-beam SEM advances nanoscience
West Virginia University has installed a Jeol JSM-7600F e-beam lithography/scanning electron microscope (SEM) in its Nanosystems Engineering Shared Cleanroom (NESC).
News from Jeol USA, Jun 4, 2009
Asylum announces Petri dish accessory
Asylum Research is introducing an enhanced Petri dish holder and heater accessory for its MFP-3D atomic force microscopes (AFMs).
News from Asylum Research, May 19, 2009
Titan ETEM microscope ordered by Stanford
FEI has announced that Stanford University has ordered the Titan 80-300 environmental transmission electron microscope (ETEM) - marking FEI's 100th order for the instrument.
News from FEI, May 8, 2009
Asylum Research announces Coolerheater accessory
Asylum Research is introducing a Coolerheater accessory designed for polymer and other studies where cooling and heating are required.
News from Asylum Research, May 4, 2009
Protochips secures finance for Aduro system
Protochips has closed on its first round of equity financing to support the introduction of the Aduro heated holder system for electron microscopy.
News from Protochips, Apr 21, 2009
EMS offers Applied Physics LaB6 and CeB6 cathodes
Applied Physics Technologies (APTech) lanthanum hexaboride (LaB6) and cerium hexaboride (CeB6 or CeBix) cathodes are now available from Electron Microscopy Sciences.
News from Electron Microscopy Sciences, Apr 16, 2009
Hitachi enhances TM-1000 electron microscope
Hitachi High-Technologies, in partnership with Deben, has enhanced the TM-1000 scanning electron microscope with the introduction of cooling and heating stages.
News from Hitachi High-Technologies, Apr 16, 2009
Asylum Research - latest company news
April 14 2009 - Asylum Research, which supplies atomic force and scanning probe microscopy (AFM/SPM) for materials and bioscience applications, celebrated its 10-year anniversary this week.
News from Asylum Research, Apr 15, 2009
Fibermetric system analyses nano-fibres
FEI has announced the Fibermetric system powered by the Phenom personal electron microscope.
News from FEI, Apr 6, 2009
Electron Microscopy announces staining workshop
Aurion and Electron Microscopy Sciences will hold their spring east coast workshop on Immuno Gold Silver Staining at Albert Einstein College of Medicine in New York from 18-21 May.
News from Electron Microscopy Sciences, Mar 19, 2009
Jeol USA - latest company news
March 17 2009 - Jeol USA has partnered with the College of Microscopy to improve the study of microscopy.
News from Jeol USA, Mar 18, 2009
Asylum Research offers AFM in Biology class
Asylum Research has announced its latest AFM in Biology class, to be held from 3-5 June 2009 in Santa Barbara, California.
News from Asylum Research, Mar 18, 2009
Jeol unveils JEM-ARM200F microscope
Jeol has introduced the JEM-ARM200F atomic resolution analytical microscope.
News from Jeol USA, Mar 17, 2009
FEI unveils Quanta 50 scanning electron microscope
FEI has announced the Quanta 50 Series scanning electron microscope (SEM).
News from FEI, Mar 17, 2009
JEOL introduces sensitive GC-TOF mass spectrometer
The AccuTOF-GCv from JEOL features one of the highest sensitivities of any GC time-of-flight mass spectrometer.
News from Jeol USA, Mar 13, 2009
Jeol to showcase new instrumentation at Pittcon
Jeol is celebrating its 60th anniversary by showcasing new microscopy and spectroscopy instrumentation at Pittcon 2009 on 8-13 March in Chicago.
News from Jeol USA, Mar 12, 2009
Asylum extends standard warranty
Asylum Research has broadened its standard warranty coverage to two years for atomic force/scanning probe microscopes (AFM/SPM).
News from Asylum Research, Mar 9, 2009
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Featured articles
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ISS - latest company news
1 July 2009 - ISS has announced that its customer CMA is now a central services facility providing imaging and analysis services and facilities to third-level, research and private sectors.
-
Natural History Museum selects Asylum Research AFM
The Natural History Museum in London has announced that its mineralogy department has acquired Asylum Research's MFP-3D stand-alone atomic force microscope (AFM) to study nanomaterials.
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