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Electron microscopy systems
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TEM reaches 300kV in three minutes
High performance tunelling electron microscope uses a single crystal LaB6 electron source and offers 0.102nm crystal lattice resolution and 0.18nm point to point resolution
News from Hitachi High-Technologies ( 4 November 2003)
Personal SEM in a box
Powerful yet cost effective 'personal' scanning electron microscope packed with features normally only found on top-of-the-range models
News from Jencons-PLS (29 October 2003)
Combined EBSD and X-ray microanalysis solution
Cooperative agreement to combine electron backscatter diffraction system and X-ray microanalysis system, providing a powerful tool for materials characterisation
News from Thermo Electron (microanalysis) (20 October 2003)
X-ray 'scope for fluorescence and transmission
Unique combination of surface and transmission X-ray analysis provides a complete elemental characterisation of a sample in one simple step
News from Jobin Yvon (15 October 2003)
Light at the end of the tunnel
New transmission detector for high resolution low voltage scanning tunnelling electron microscope gives excellent contrast on low density materials
News from Hitachi High-Technologies (25 September 2003)
Ultra-high resolution field emission VPSEM
Field emission variable pressure scanning electron microscope combines the high resolution and image quality of a field emission source with the versatility of variable pressure operation
News from Hitachi High-Technologies (10 July 2003)
Scanning electrochemical microscope
Scanning micro-electrode workstation can be used to monitor or impose current flowing between a micro-electrode and a specimen surface in solution
News from Uniscan Instruments ( 7 July 2003)
Desktop electron microscope
Transmission and scanning electron microscope will be demonstrated at the Israel Society for Microscopy 2003 annual meeting
News from Delong Instruments ( 1 April 2003)
Host of applications for ESE detector
Allows imaging to take place as a result of a process involving the secondary electrons generated in the VPSEM, which are impossible to collect under normal operating conditions
News from Hitachi High-Technologies ( 6 March 2003)
A new breed of electron microscope
Delong Instruments has unveiled the LVEM5, introducing what it says is a new breed of Electron Microscope.
News from Delong Instruments (14 January 2003)
VPSEM for large samples
Scanning electron microscope is capable of handling specimens up to 254mm in diameter, 70mm in height, and 2kg in weight
News from Hitachi High-Technologies (16 October 2002)
Preferred quality supplier award
One of just 25 companies receiving an award for outstanding performance in providing products and services considered essential to Intel's success
News from Hitachi High-Technologies (28 June 2002)
Ultra-high resolution Fesem for large samples
A new Fesem which combines the resolution capabilities normally associated with in-lens instruments with the sample handling of more conventional instruments
News from Hitachi High-Technologies (27 June 2002)
Enhanced backscattered electron detection
Optional additional electron detector improves imaging versatility of scanning electron microscope, allowing compositional information to be acquired at low accelerating voltages
News from Hitachi High-Technologies (16 April 2002)
Improved scanning electron microscope
Hitachi High-Technologies has announced a number of improvements for the S-4700 field emission SEM, which give significantly better image quality, particularly at low accelerating voltages
News from Hitachi High-Technologies (28 January 2002)
A net revolution in electron microscopy
Hitachi High-Technologies has introduced a new electron microscope demonstration facility linking all of its electron microscopy facilities through the internet
News from Hitachi High-Technologies (11 December 2001)
Restructuring at Hitachi
From 1 October 2001, Nissei Sangyo will be known as Hitachi High-Technologies Corporation (HHTC), following the merger between it and Hitachi's Instrument Group
News from Hitachi High-Technologies (25 September 2001)
Low cost scanning electron microscope
Hitachi Scientific Instruments has launched the entry level S-2600N/H SEMs with the specific intention of making the technique available to those working on restricted budgets
News from Hitachi High-Technologies (13 August 2001)
New autofocus TEM
Hitachi has announced a new high performance thermionic transmission electron microscope, offering high contrast and high resolution operating modes
News from Hitachi High-Technologies ( 8 August 2001)
New in-lens FESEM
Significantly improved resolution and imaging capabilities promised by new Windows NT-controlled S-5200 in-lens cold cathode field emission scanning electron microscope
News from Hitachi High-Technologies (10 July 2001)
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