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Electron microscopy systems
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Half a century of scanning electron microscopy
Achievements of Cambridge University engineering department and the Cambridge Instrument Company, now Carl Zeiss SMT, are commemorated at Cambridge Philosophical Society meeting
News from Carl Zeiss (24 December 2004)
First atom probe sale in China
Instrument provides materials scientists with the ability to simultaneously determine the spatial position and chemical identity of individual atoms in conducting materials
News from Oxford Nanoscience (16 December 2004)
Atom probe wins measurement award
The 3DAP was developed in the materials department of Oxford University by Professors Alfred Cerezo and George Smith, and is now available as a commercial instrument
News from Oxford Nanoscience ( 9 December 2004)
TEM has ultra-high sensitivity
This ultra-high sensitivity digital imaging transmission electron microscope offers sensitivity approximately 40 times greater than can be obtained using conventional film
News from Hitachi High-Technologies (23 November 2004)
VPSEM promises outstanding performance
Variable pressure scanning electron microscope has new electron optics, detector, pumping system and enhanced sample handling and analysis capabilities
News from Hitachi High-Technologies (12 October 2004)
Sales of 3D atom probes to Japan
User application article Oxford Nanoscience announces continuing success in the sale of its 3DAP thtree-dimensional atom probes into Japan
News from Oxford Nanoscience (12 October 2004)
Catalysis cell for 3D atom probe
Oxford Nanoscience has announced the availability of a new accessory for the 3DAP three-dimensional atom probe
News from Oxford Nanoscience ( 1 September 2004)
Versatility in microscopy analysis
Instrument claims outstanding analysis capabilities on field emission variable pressure scanning electron microscope
News from Hitachi High-Technologies (13 August 2004)
Award for new direction in atomic force microscopy
Said to be the only commercially available instrument to add real-time, simultaneous topography and recognition imaging capability to the atomic force microscope
News from Molecular Imaging ( 2 August 2004)
Nanometre spatial resolution with Stem
Scanning transmission electron microscope offers outstanding mapping and analysis through electron energy loss spectroscopy or energy dispersive X-ray systems
News from Hitachi High-Technologies (29 July 2004)
X-ray microanalysis improvements
New products and software introduce significant advancements for analytical methods and dramatically improve laboratory productivity, says company.
News from Thermo Electron (microanalysis) (29 July 2004)
Electron microscope for protein research
Desktop instrument provides high resolution direct observation of protein preparations in native state, particularly useful for membrane protein preparations
News from Delong Instruments ( 7 July 2004)
Breakthrough in Fesem technology
Instrument combines large sample handling capabilities with the image resolution normally associated with in-lens scanning electron microscopes
News from Hitachi High-Technologies (28 June 2004)
Three-dimensional atom probe on show
Technique provides materials characterisation capabilities with the resolution needed to investigate nanostructured materials in order to understand and control their properties
News from Oxford Nanoscience (28 June 2004)
Nanotechnology boosts company flotation
Three-dimensional atom probe system offers unique materials characterisation capabilities by allowing both visualisation and analysis of materials at the atomic scale
News from Oxford Nanoscience (24 May 2004)
Resolution improvement by 30% for Fesem
Beam deceleration technology offers even better resolution capabilities at low accelerating voltages for field emission scanning electron microscope
News from Hitachi High-Technologies (21 May 2004)
3D imaging at the nanoscale
Three-dimensional atomic probe imaging with chemical identification boosts materials characterisation at the nanoscale level
News from Oxford Nanoscience ( 1 April 2004)
New man behind the electron microscope
Takes over responsibility for all electron microscope demonstrations, applications work and training
News from Hitachi High-Technologies (19 March 2004)
Stem offers improved resolution
New scanning transmission electron microscope provides the capability for real-time element mapping with 2nm spatial resolution
News from Hitachi High-Technologies ( 2 February 2004)
Precision stage for AFM imaging
Extremely accurate positioning stage designed for use in surface characterisation of large samples under atomic force microscopy
News from Molecular Imaging (15 December 2003)
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