Electron microscopy systems
(a sub category of Analytical instruments)
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Latest articles from 'Electron microscopy systems'
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Showing 101-125 of 243 articles
Nikon and Jeol launch NeoScope benchtop SEM
NeoScope, targeted at the bioscience research and industrial inspection communities, fills the optical microscopist's need for advanced imaging capability that is both affordable and easy to use.
News from Jeol USA, Mar 4, 2008
Tabletop microscope is kinder to the environment
Hitachi High-Technologies says its TM-1000 tabletop microscope is measurably kinder to the environment than the company's previous entry-level scanning electron microscope
News from Hitachi High-Technologies, Mar 3, 2008
Boeckeler to distribute Jeol sample prep tool
Boeckeler's RMC products division of Tucson, Arizona, a manufacturer of microtomes for sample preparation, will act as distributor for Jeol's unique sample preparation tool, the Cross Section Polisher
News from Jeol USA, Feb 25, 2008
Titan Krios opens eyes for structural biology
FEI has introduced what it says is a revolutionary, high-throughput, cryo transmission electron microscope (TEM) that combines high-throughput sample handling with state-of-the-art electron optics
News from FEI, Feb 5, 2008
FEI has opened a Nanoport in Shanghai, China
FEI NanoPorts are located in key centres of technology excellence where there is a critical number of customers and partners to encourage the advancement of nanoscale development
News from FEI, Jan 22, 2008
Technology in education of reintegrated scientist
Boston College has selected the new Jeol MultiBeam focused ion beam system and a field emission scanning electron microscope for its nanofabrication clean room facility in Newton, Massachusetts
News from Jeol USA, Jan 18, 2008
Scanning electron microscope is 'portable'
The new CarryScope is described as the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene
News from Jeol USA, Jan 9, 2008
Developing tools for single-atom imaging
Ambitious research programme seeks to advance electron microscopes and focused ion beam systems (FIBs) so that the structure of materials can be made visible and processed at the single-atom scale
News from FEI, Dec 20, 2007
The electron microscope and the moon walker
Philadelphia's Central High School became the first in the USA to open deep inner space exploration to students with the arrival of a new Phenom table top scanning electron microscope
News from FEI, Nov 21, 2007
First Titan S/Tem installed in Sweden
Chalmers University of Technology is the first institute in Sweden to instal an FEI Titan scanning/transmission election microscope (S/Tem), the world's most powerful commercially-available microscope
News from FEI, Nov 19, 2007
Tabletop microscope performs chemical analysis
The latest development for the highly successful TM-1000 tabletop microscope from Hitachi is the addition of chemical microanalysis by EDX, to create an even more powerful investigation technique
News from Hitachi High-Technologies, Nov 14, 2007
Titan electron microscope raised to a power
Known as the 'Titan cubed' because of its fully enclosed profile, it is designed to deliver the highest stability and performance in a commercial scanning/transmission electron microscope (S/TEM)
News from FEI, Oct 22, 2007
Electron microscopes score three hits at USC
University of Southern California (USC) has purchased three electron microscopes from Jeol USA for its new Center of Excellence for Nano-Imaging in Los Angeles, California
News from Jeol USA, Oct 5, 2007
Smallest details ever seen by electron microscopy
A microscopy breakthrough for the Team project as details as small as 0.5angstrom (0.05nanometre) are resolved in scanning transmission electron microscope (STEM) mode
News from FEI, Sep 11, 2007
ISS distributes Tescan SEM systems in UK, Ireland
Tescan, a European manufacturer of scanning electron microscopes, has appointed ISS as its distributor for the UK and Ireland
News from ISS, Aug 31, 2007
New CLUE upgrade for SEMs is revealed
The Optical Spectroscopy Division of Horiba Jobin Yvon has introduced a new Cathodoluminescence Universal Extension (CLUE) upgrade for Scanning Electron Microscopes (SEMs)
News from Horiba Jobin Yvon, Aug 17, 2007
Silicon drift detectors offer low energy benefits
Thermo Fisher Scientific has unveiled a new and improved large-area UltraDry silicon drift detector for electron microscopes
News from Thermo Fisher Scientific (Microanalysis), Aug 9, 2007
New high-sensitivity NMR spectrometer goes on show
JEOL USA is introducing its new compact, high-performance ECS-400 400MHz NMR spectrometer featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet
News from Jeol USA, Aug 9, 2007
New SEM offers ultra-high resolution imaging
FEI has introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM 30 series
News from FEI, Aug 7, 2007
'Super microprobe' installation completed at Nist
Jeol JXA-8500F is a unique type of electron microscope with analytical ability said to surpass that of even the most advanced scanning electron microscopes (SEM) available today
News from Jeol USA, Aug 6, 2007
Video games teach nanotechnology to inspire youth
As a sponsor of two modules (NanoScaling and NanoImaging) in the new NanoMission series of video games, FEI hopes to inspire young gamers as they adventure into the world of the nanoscale
News from FEI, Aug 2, 2007
RMC family of microtomes for sample preparation
AFM-990 precision motorised microtome has been designed for users of all microscopy techniques: optical, scanning electron and scanning probe systems
News from ISS, Jul 26, 2007
Next generation cryo sample preparation tool
Vitrobot Mark IV is an easy-to-use system that features a newly-designed touchscreen user interface operated under Linux, and robotics that ensures high-quality, reproducible freezing of samples
News from FEI, Jul 16, 2007
300kV field emission TEM to be launched at Emag
Hitachi High Technologies says it will make a number of new product announcements at the Emag Exhibition, University of Glasgow, 3-7 September 2007
News from Hitachi High-Technologies, Jul 16, 2007
20 times the power at one-third the price
At approximately one-third the price of a traditional SEM, the Phenom will be affordable for many more undergraduate and community college programmes mainstreaming access to the nanoscale
News from FEI, Jun 29, 2007
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