Electron microscopy systems

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Tabletop microscopes on show at Buckingham Palace

Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006

News from Hitachi High-Technologies ( 5 December 2006)

Major order from Technical University of Denmark

User application article Seven systems valued at US$11.5 million to form the core of DTU's new centre for electron nanoscopy and pave the way for advanced catalyst research

News from FEI (29 November 2006)

U of Ulster opens centre for advanced imaging

User application article University of Ulster has opened the FEI Centre for Advanced Imaging in Northern Ireland, to provide electron microscopes for research within the university's Biomedical Sciences Research Institute

News from FEI (27 October 2006)

Imperial College unveils UK's first Titan S/Tem

User application article World's most powerful commercially-available microscope provides access to atomic-scale data for nanotechnology research

News from FEI (20 October 2006)

IMP opens new microscopy centre with FEI tools

User application article Mexico's national research petroleum institute, the Instituto Mexicano del Petroleo (IMP), will open its new centre for advanced microscopy and research this week

News from FEI ( 5 October 2006)

Programme for advanced nanoparticle analysis

Technical background article FEI's Quanta SEMs and Malvern's advanced particle analysis software combine to deliver ground-breaking solution for nanoscale applications

News from FEI (14 September 2006)

Six awards in six years

For the sixth consecutive year, Jeol USA has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations

News from Jeol USA (13 September 2006)

FEI receives Titan order from Japanese steelmaker

User application article Designed for dedicated correction and monochromator technology, the Titan S/Tem is the world's highest resolution commercially-available microscope, yielding powerful sub-Angstrom imaging and analysis

News from FEI ( 7 September 2006)

Hitachi contributes to microscopy congress

Representatives will reinforce company's expertise in electron optics by making a significant contribution to the 16th International Microscopy Congress (IMC16) in Sapporo, Japan, 2-8 September 2006

News from Hitachi High-Technologies (18 August 2006)

Thermo upgrades its X-ray microanalysis system

Thermo Electron has improved its X-ray microanalysis system, Noran System Six, enabling superior productivity gains in high throughput microstructure characterization laboratories

News from Thermo Electron (microanalysis) ( 3 August 2006)

FEI launches top-of-line research dualbeam at M+M

Helios NanoLab features ultra-high resolution field emission SEM column combined with Sidewinder FIB column and gas chemistries to provide new levels of imaging resolution and contrast

News from FEI ( 2 August 2006)

Titan S/TEM achieves low kV milestone

Technical background article 1.4 Angstrom resolution at the very low operating voltage of 80kV marks an important breakthrough for atomic-scale imaging of light element nanomaterials

News from FEI ( 2 August 2006)

Kania named president and CEO of FEI

FEI announces today that Don R Kania has been named by the board of directors as president, chief executive officer and a board member of the company

News from FEI (28 July 2006)

Complete nanoparticle characterisation wins fans

User application article Pacific Nanotechnology (PNI) reports that the first dedicated SPM system for the characterisation of nanoparticles is being accepted by researchers the world over

News from Pacific Nanotechnology (17 July 2006)

Large chamber analytical VPSEM launched by Hitachi

S-3700N Variable Pressure scanning electron microscope (VPSEM) has analytical chamber capable of accepting samples up to 300mm across and 11 accessory ports for analytical and experimental equipment

News from Hitachi High-Technologies (14 July 2006)

FEI launches certified tools programme globally

FEI has announced the global launch of its Certified Tools programme featuring factory-refurbished FEI systems that are fully-tested and warranted to meet original factory specifications

News from FEI (12 July 2006)

Fei prepares shipments of US team project systems

FEI has received US (DoE) contracts for four Titan scanning/transmission electron microscopes (S/Tems) developed as part of the Team (transmission electron aberration-corrected microscope) project