Electron microscopy systems
(a sub category of Analytical instruments)
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Latest articles from 'Electron microscopy systems'
News releases from this sub-category
Showing 126-150 of 245 articles
300kV field emission TEM to be launched at Emag
Hitachi High Technologies says it will make a number of new product announcements at the Emag Exhibition, University of Glasgow, 3-7 September 2007
News from Hitachi High-Technologies, Jul 16, 2007
20 times the power at one-third the price
At approximately one-third the price of a traditional SEM, the Phenom will be affordable for many more undergraduate and community college programmes mainstreaming access to the nanoscale
News from FEI, Jun 29, 2007
Mass spec applications booklet now in 3rd edition
The AccuTof time-of-flight mass spectrometer provides exact masses and accurate isotopic abundances that can be used to confirm sample composition or determine the elemental composition of unknowns
News from Jeol USA, Jun 27, 2007
VPSEM software simplifies 3D analysis
Software provides an easy-to-use alternative for acquiring 3D information compared to methods that either involve manual tilting of the specimen or electronic tilting of the incident electron beam
News from Hitachi High-Technologies, Jun 21, 2007
Controller further extends atomic force microscopy
The Agilent Mac Mode III allows one-pass multi-channel detection for Kelvin force microscopy (KFM) and electric force microscopy (EFM)
News from Agilent Technologies Europe, Jun 12, 2007
Electron microscope shines at fossil festival
Hitachi's TM-1000 tabletop electron microscope proved to be a popular attraction at the recent 'Rising Seas' Lyme Regis Fossil Festival in Dorset, UK
News from Hitachi High-Technologies, May 24, 2007
Remote diagnostics for electron microscopes
With Rapid, service engineers will run service test software and diagnostics on systems that are equipped for Rapid whenever a customer initiates a service call and the remote diagnostics protocol
News from FEI, May 24, 2007
Electron microscopy catalogue is encyclopaedic
Electron Microscopy Sciences says its Catalog XV is the most complete collection of products for light microscopy, histology and electron microscopy, and general biological and materials research
News from Electron Microscopy Sciences, May 17, 2007
Seventh consecutive Omega award for service
For the seventh consecutive year, Jeol USA has received the Omega NorthFace Scoreboard award in recognition of its commitment to providing exemplary service and exceeding customer expectations
News from Jeol USA, May 10, 2007
Brain imaging in 3D at high resolution
Researchers at Harvard University's department of molecular and cellular biology have selected Jeol as a partner in a collaborative effort to map the brain using high resolution SEM images
News from Jeol USA, Apr 30, 2007
Global warming put under the microscope, literally
The Rising Seas Lyme Regis Fossil Festival brings together scientific institutions and universities with the local community and will consider issues such as "who is responsible for global warming?"
News from Hitachi High-Technologies, Apr 30, 2007
Pet food testing method is a 'breakthrough'
A professor and graduate student in University of the Pacific's chemistry department have developed a new method for determining how to identify foreign substances in pet food
News from Jeol USA, Apr 26, 2007
First table-top SEM wins recognition of excellence
Robert Cresanti, US under secretary of commerce for technology, has presented FEI with a special Recognition of Excellence in Innovation award for the Phenom tabletop scanning electron microscope
News from FEI, Apr 6, 2007
Jeol Technics ships 10,000th electron microscope
Jeol Technic, one of Jeol USA's design and manufacturing branches in Akashima, Japan, has shipped its 10,000th scanning electron microscope (SEM)
News from Jeol USA, Mar 30, 2007
Automated SEM analysis for minerals exploration
The combined solution features FEI's Quanta SEM and JKTech's Mineral Liberation Analyzer software and is available now with liquid-nitrogen-free, high throughput silicon drift EDS technology
News from FEI, Mar 28, 2007
Nano-DST: an advanced platform for AFM research
Pacific Nanotechnology (PNI), having introduced the tabletop Nano-R AFM systems, now brings an advanced platform for research applications delivering dual scanner technology, the Nano-DST
News from Pacific Nanotechnology, Mar 7, 2007
3D nanoscale characterisation and analysis
Quanta 3D FEG expands FEI's DualBeam portfolio; high-resolution, low-vacuum SEM/FIB DualBeam delivers versatile solutions for advanced 3D nanoscale characterisation, analysis and prototyping
News from FEI, Feb 22, 2007
Three electron microscopes for UCLA
The California NanoSystems Institute (CNSI) at UCLA has selected FEI for three advanced transmission electron microscopes for its Electron Imaging Center for NanoMachines (EICN) core laboratory
News from FEI, Jan 11, 2007
High performance Stem has new electron optics
By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens
News from Hitachi High-Technologies, Jan 10, 2007
New capabilities for scanning electron microscopes
AP Technologies announces the new 3Max detector from El-Mul Technologies of Yavne, Israel, described as the first true innovation in Everhart-Thornley (ET) type chamber detectors in over 40 years
News from AP Technologies, Jan 5, 2007
Tabletop microscopes on show at Buckingham Palace
Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006
News from Hitachi High-Technologies, Dec 5, 2006
Major order from Technical University of Denmark
Seven systems valued at US$11.5 million to form the core of DTU's new centre for electron nanoscopy and pave the way for advanced catalyst research
News from FEI, Nov 29, 2006
U of Ulster opens centre for advanced imaging
University of Ulster has opened the FEI Centre for Advanced Imaging in Northern Ireland, to provide electron microscopes for research within the university's Biomedical Sciences Research Institute
News from FEI, Oct 27, 2006
Imperial College unveils UK's first Titan S/Tem
World's most powerful commercially-available microscope provides access to atomic-scale data for nanotechnology research
News from FEI, Oct 20, 2006
IMP opens new microscopy centre with FEI tools
Mexico's national research petroleum institute, the Instituto Mexicano del Petroleo (IMP), will open its new centre for advanced microscopy and research this week
News from FEI, Oct 5, 2006
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