Electron microscopy systems

(a sub category of Analytical instruments)

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Latest articles from 'Electron microscopy systems'

News releases from this sub-category

Showing 126-150 of 245 articles

300kV field emission TEM to be launched at Emag

Hitachi High Technologies says it will make a number of new product announcements at the Emag Exhibition, University of Glasgow, 3-7 September 2007

News from Hitachi High-Technologies, Jul 16, 2007

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20 times the power at one-third the price

At approximately one-third the price of a traditional SEM, the Phenom will be affordable for many more undergraduate and community college programmes mainstreaming access to the nanoscale

News from FEI, Jun 29, 2007

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Mass spec applications booklet now in 3rd edition

The AccuTof time-of-flight mass spectrometer provides exact masses and accurate isotopic abundances that can be used to confirm sample composition or determine the elemental composition of unknowns

News from Jeol USA, Jun 27, 2007

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VPSEM software simplifies 3D analysis

Software provides an easy-to-use alternative for acquiring 3D information compared to methods that either involve manual tilting of the specimen or electronic tilting of the incident electron beam

News from Hitachi High-Technologies, Jun 21, 2007

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Controller further extends atomic force microscopy

The Agilent Mac Mode III allows one-pass multi-channel detection for Kelvin force microscopy (KFM) and electric force microscopy (EFM)

News from Agilent Technologies Europe, Jun 12, 2007

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Electron microscope shines at fossil festival

Hitachi's TM-1000 tabletop electron microscope proved to be a popular attraction at the recent 'Rising Seas' Lyme Regis Fossil Festival in Dorset, UK

News from Hitachi High-Technologies, May 24, 2007

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Remote diagnostics for electron microscopes

With Rapid, service engineers will run service test software and diagnostics on systems that are equipped for Rapid whenever a customer initiates a service call and the remote diagnostics protocol

News from FEI, May 24, 2007

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Electron microscopy catalogue is encyclopaedic

Electron Microscopy Sciences says its Catalog XV is the most complete collection of products for light microscopy, histology and electron microscopy, and general biological and materials research

News from Electron Microscopy Sciences, May 17, 2007

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Seventh consecutive Omega award for service

For the seventh consecutive year, Jeol USA has received the Omega NorthFace Scoreboard award in recognition of its commitment to providing exemplary service and exceeding customer expectations

News from Jeol USA, May 10, 2007

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Brain imaging in 3D at high resolution

Researchers at Harvard University's department of molecular and cellular biology have selected Jeol as a partner in a collaborative effort to map the brain using high resolution SEM images

News from Jeol USA, Apr 30, 2007

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Global warming put under the microscope, literally

The Rising Seas Lyme Regis Fossil Festival brings together scientific institutions and universities with the local community and will consider issues such as "who is responsible for global warming?"

News from Hitachi High-Technologies, Apr 30, 2007

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Pet food testing method is a 'breakthrough'

A professor and graduate student in University of the Pacific's chemistry department have developed a new method for determining how to identify foreign substances in pet food

News from Jeol USA, Apr 26, 2007

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First table-top SEM wins recognition of excellence

Robert Cresanti, US under secretary of commerce for technology, has presented FEI with a special Recognition of Excellence in Innovation award for the Phenom tabletop scanning electron microscope

News from FEI, Apr 6, 2007

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Jeol Technics ships 10,000th electron microscope

Jeol Technic, one of Jeol USA's design and manufacturing branches in Akashima, Japan, has shipped its 10,000th scanning electron microscope (SEM)

News from Jeol USA, Mar 30, 2007

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Automated SEM analysis for minerals exploration

The combined solution features FEI's Quanta SEM and JKTech's Mineral Liberation Analyzer software and is available now with liquid-nitrogen-free, high throughput silicon drift EDS technology

News from FEI, Mar 28, 2007

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Nano-DST: an advanced platform for AFM research

Pacific Nanotechnology (PNI), having introduced the tabletop Nano-R AFM systems, now brings an advanced platform for research applications delivering dual scanner technology, the Nano-DST

News from Pacific Nanotechnology, Mar 7, 2007

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3D nanoscale characterisation and analysis

Quanta 3D FEG expands FEI's DualBeam portfolio; high-resolution, low-vacuum SEM/FIB DualBeam delivers versatile solutions for advanced 3D nanoscale characterisation, analysis and prototyping

News from FEI, Feb 22, 2007

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Three electron microscopes for UCLA

The California NanoSystems Institute (CNSI) at UCLA has selected FEI for three advanced transmission electron microscopes for its Electron Imaging Center for NanoMachines (EICN) core laboratory

News from FEI, Jan 11, 2007

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High performance Stem has new electron optics

By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens

News from Hitachi High-Technologies, Jan 10, 2007

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New capabilities for scanning electron microscopes

AP Technologies announces the new 3Max detector from El-Mul Technologies of Yavne, Israel, described as the first true innovation in Everhart-Thornley (ET) type chamber detectors in over 40 years

News from AP Technologies, Jan 5, 2007

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Tabletop microscopes on show at Buckingham Palace

Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006

News from Hitachi High-Technologies, Dec 5, 2006

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Major order from Technical University of Denmark

Seven systems valued at US$11.5 million to form the core of DTU's new centre for electron nanoscopy and pave the way for advanced catalyst research

News from FEI, Nov 29, 2006

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U of Ulster opens centre for advanced imaging

University of Ulster has opened the FEI Centre for Advanced Imaging in Northern Ireland, to provide electron microscopes for research within the university's Biomedical Sciences Research Institute

News from FEI, Oct 27, 2006

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Imperial College unveils UK's first Titan S/Tem

World's most powerful commercially-available microscope provides access to atomic-scale data for nanotechnology research

News from FEI, Oct 20, 2006

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IMP opens new microscopy centre with FEI tools

Mexico's national research petroleum institute, the Instituto Mexicano del Petroleo (IMP), will open its new centre for advanced microscopy and research this week

News from FEI, Oct 5, 2006

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Showing 126-150 of 245 articles

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