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Electron microscopy systems
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300kV field emission TEM to be launched at Emag
Hitachi High Technologies says it will make a number of new product announcements at the Emag Exhibition, University of Glasgow, 3-7 September 2007
News from Hitachi High-Technologies (16 July 2007)
20 times the power at one-third the price
At approximately one-third the price of a traditional SEM, the Phenom will be affordable for many more undergraduate and community college programmes mainstreaming access to the nanoscale
News from FEI (29 June 2007)
Mass spec applications booklet now in 3rd edition
The AccuTof time-of-flight mass spectrometer provides exact masses and accurate isotopic abundances that can be used to confirm sample composition or determine the elemental composition of unknowns
News from Jeol USA (27 June 2007)
VPSEM software simplifies 3D analysis
Software provides an easy-to-use alternative for acquiring 3D information compared to methods that either involve manual tilting of the specimen or electronic tilting of the incident electron beam
News from Hitachi High-Technologies (21 June 2007)
Controller further extends atomic force microscopy
The Agilent Mac Mode III allows one-pass multi-channel detection for Kelvin force microscopy (KFM) and electric force microscopy (EFM)
News from Agilent Technologies Europe (12 June 2007)
Electron microscope shines at fossil festival
User application article Hitachi's TM-1000 tabletop electron microscope proved to be a popular attraction at the recent 'Rising Seas' Lyme Regis Fossil Festival in Dorset, UK
News from Hitachi High-Technologies (24 May 2007)
Remote diagnostics for electron microscopes
With Rapid, service engineers will run service test software and diagnostics on systems that are equipped for Rapid whenever a customer initiates a service call and the remote diagnostics protocol
News from FEI (24 May 2007)
Electron microscopy catalogue is encyclopaedic
Electron Microscopy Sciences says its Catalog XV is the most complete collection of products for light microscopy, histology and electron microscopy, and general biological and materials research
News from Electron Microscopy Sciences (17 May 2007)
Seventh consecutive Omega award for service
For the seventh consecutive year, Jeol USA has received the Omega NorthFace Scoreboard award in recognition of its commitment to providing exemplary service and exceeding customer expectations
News from Jeol USA (10 May 2007)
Brain imaging in 3D at high resolution
Technical background article Researchers at Harvard University's department of molecular and cellular biology have selected Jeol as a partner in a collaborative effort to map the brain using high resolution SEM images
News from Jeol USA (30 April 2007)
Global warming put under the microscope, literally
The Rising Seas Lyme Regis Fossil Festival brings together scientific institutions and universities with the local community and will consider issues such as "who is responsible for global warming?"
News from Hitachi High-Technologies (30 April 2007)
Pet food testing method is a 'breakthrough'
Technical background article A professor and graduate student in University of the Pacific's chemistry department have developed a new method for determining how to identify foreign substances in pet food
News from Jeol USA (26 April 2007)
First table-top SEM wins recognition of excellence
Robert Cresanti, US under secretary of commerce for technology, has presented FEI with a special Recognition of Excellence in Innovation award for the Phenom tabletop scanning electron microscope
News from FEI ( 6 April 2007)
Jeol Technics ships 10,000th electron microscope
User application article Jeol Technic, one of Jeol USA's design and manufacturing branches in Akashima, Japan, has shipped its 10,000th scanning electron microscope (SEM)
News from Jeol USA (30 March 2007)
Automated SEM analysis for minerals exploration
The combined solution features FEI's Quanta SEM and JKTech's Mineral Liberation Analyzer software and is available now with liquid-nitrogen-free, high throughput silicon drift EDS technology
News from FEI (28 March 2007)
Nano-DST: an advanced platform for AFM research
Pacific Nanotechnology (PNI), having introduced the tabletop Nano-R AFM systems, now brings an advanced platform for research applications delivering dual scanner technology, the Nano-DST
News from Pacific Nanotechnology ( 7 March 2007)
3D nanoscale characterisation and analysis
Quanta 3D FEG expands FEI's DualBeam portfolio; high-resolution, low-vacuum SEM/FIB DualBeam delivers versatile solutions for advanced 3D nanoscale characterisation, analysis and prototyping
News from FEI (22 February 2007)
Three electron microscopes for UCLA
User application article The California NanoSystems Institute (CNSI) at UCLA has selected FEI for three advanced transmission electron microscopes for its Electron Imaging Center for NanoMachines (EICN) core laboratory
News from FEI (11 January 2007)
High performance Stem has new electron optics
By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens
News from Hitachi High-Technologies (10 January 2007)
New capabilities for scanning electron microscopes
AP Technologies announces the new 3Max detector from El-Mul Technologies of Yavne, Israel, described as the first true innovation in Everhart-Thornley (ET) type chamber detectors in over 40 years
News from AP Technologies ( 5 January 2007)
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