Electron microscopy systems
(a sub category of Analytical instruments)
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Latest articles from 'Electron microscopy systems'
News releases from this sub-category
Showing 151-175 of 243 articles
FEI receives Titan order from Japanese steelmaker
Designed for dedicated correction and monochromator technology, the Titan S/Tem is the world's highest resolution commercially-available microscope, yielding powerful sub-Angstrom imaging and analysis
News from FEI, Sep 7, 2006
Hitachi contributes to microscopy congress
Representatives will reinforce company's expertise in electron optics by making a significant contribution to the 16th International Microscopy Congress (IMC16) in Sapporo, Japan, 2-8 September 2006
News from Hitachi High-Technologies, Aug 18, 2006
Thermo upgrades its X-ray microanalysis system
Thermo Electron has improved its X-ray microanalysis system, Noran System Six, enabling superior productivity gains in high throughput microstructure characterization laboratories
News from Thermo Electron (microanalysis), Aug 3, 2006
FEI launches top-of-line research dualbeam at M+M
Helios NanoLab features ultra-high resolution field emission SEM column combined with Sidewinder FIB column and gas chemistries to provide new levels of imaging resolution and contrast
News from FEI, Aug 2, 2006
Titan S/TEM achieves low kV milestone
1.4 Angstrom resolution at the very low operating voltage of 80kV marks an important breakthrough for atomic-scale imaging of light element nanomaterials
News from FEI, Aug 2, 2006
Kania named president and CEO of FEI
FEI announces today that Don R Kania has been named by the board of directors as president, chief executive officer and a board member of the company
News from FEI, Jul 28, 2006
Complete nanoparticle characterisation wins fans
Pacific Nanotechnology (PNI) reports that the first dedicated SPM system for the characterisation of nanoparticles is being accepted by researchers the world over
News from Pacific Nanotechnology, Jul 17, 2006
Large chamber analytical VPSEM launched by Hitachi
S-3700N Variable Pressure scanning electron microscope (VPSEM) has analytical chamber capable of accepting samples up to 300mm across and 11 accessory ports for analytical and experimental equipment
News from Hitachi High-Technologies, Jul 14, 2006
FEI launches certified tools programme globally
FEI has announced the global launch of its Certified Tools programme featuring factory-refurbished FEI systems that are fully-tested and warranted to meet original factory specifications
News from FEI, Jul 12, 2006
Fei prepares shipments of US team project systems
FEI has received US (DoE) contracts for four Titan scanning/transmission electron microscopes (S/Tems) developed as part of the Team (transmission electron aberration-corrected microscope) project
News from FEI, Jun 14, 2006
New generation atomic force microscope
The Nano-R2 is a multipurpose scanning probe microscope for capturing images and making measurements of structures on the nanometer scale
News from Pacific Nanotechnology, Jun 9, 2006
Russia opens new nanotech centre with FEI tools
FEI plays key role in Moscow's new pilot scientific and technical center of excellence for nanotechnology development
News from FEI, Jun 7, 2006
Making measurements on the nanometre scale
The Nano-R2 is a multipurpose scanning probe microscope for capturing images and making measurements of structures on the nanometre scale
News from Pacific Nanotechnology, May 24, 2006
New generation of scanning microscopy
Uniscan Instruments has launched a new concept in scanning probe electrochemistry instrumentation with the introduction of the model 370 scanning electrochemical workstation
News from Uniscan Instruments, May 23, 2006
Enabling nanoscale materials research
Brazil's National Institute of Metrology, Standardization and Industrial Quality - Inmetro - has selected FEI to supply a suite of tools that enable nanoscale materials research
News from FEI, May 11, 2006
Launch leads largest ever instrument showing
Microscience 2006 sees the largest ever showing of electron microscopes by Hitachi at a UK show, including a brand new variable pressure analytical scanning electron microscope
News from Hitachi High-Technologies, Apr 21, 2006
LAT brings tabletop microscope to Microscience
Lambda Advanced Technology (LAT) will be showing the recently announced Hitachi TM-1000 tabletop microscope at Microscience 2006
News from Lambda Advanced Technology, Apr 21, 2006
McMaster University orders two FEI Titan S/Tems
Two of the world's first commercial systems capable of delivering sub-Angstrom resolution will be installed at Canada's National Facility for Ultrahigh-Resolution Electron Microscopy at McMaster
News from FEI, Apr 21, 2006
Distributor for atomic force microscopes in Mexico
Molecular Imaging has selected Tecnica En Laboratorios as the sole distributor for its line of scanning probe and atomic force microscope (SPM and AFM) products in Mexico
News from Molecular Imaging, Apr 20, 2006
Atomic force microscope distributor for Canada
Molecular Imaging has appointed Spectra Research Corporation (SRC) as the sole distributor for its line of scanning probe and atomic force microscope (SPM and AFM) products in Canada
News from Molecular Imaging, Apr 20, 2006
Simultaneous topography and recognition in AFM
Picotrec is world's first simultaneous topography and recognition imaging system for atomic force microscopy; new label-less molecular recognition tool kit provides single-molecule sensitivity
News from Molecular Imaging, Apr 20, 2006
Tabletop microscope as easy as a digital camera
The new TM-1000 tabletop microscope from Hitachi High-Technologies is set to transform the field of basic microscopy
News from Hitachi High-Technologies, Apr 10, 2006
UK contracts from three major suppliers
SS Group Services, a specialist in the supply and support of innovative microscopy and analytical instrumentation, has secured three exclusive new distribution contracts
News from ISS, Apr 6, 2006
FEI and Sidec tackle validation of drug targets
FEI and Sidec Technologies will collaborate on the commercialisation of protein tomography based on Sidec's software and intellectual property, and FEI's transmission electron microscopes (TEMs)
News from FEI, Mar 29, 2006
New Quantax Quad EDS system shown at Pittcon 2006
At Pittcon 2006, Bruker AXS Microanalysis exhibited its recently announced Quantax Quad ultra-fast and sensitive EDS system for X-ray microanalysis on electron microscopes
News from Bruker Daltonics, Mar 28, 2006
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