Electron microscopy systems
(a sub category of Analytical instruments)
A - Z list of suppliers
Click on a letter below to find a supplier...
Latest articles from 'Electron microscopy systems'
News releases from this sub-category
Showing 176-200 of 242 articles
Expansion of electron microscope sales area
Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes
News from Hitachi High-Technologies, Mar 22, 2006
Automated 3D crystallography featured at Pittcon
At Pittcon 2006, FEI is featuring its EBS3 DualBeam system for rapid serial sectioning and 3D crystallographic reconstruction of materials.
News from FEI, Mar 16, 2006
BASF chooses FEI system for nanoparticle R+D
The Strata 400 will be utilised in BASF laboratories, along with previously installed FEI Tecnai transmission electron microscopes (TEMs) for a wide range of R+D projects
News from FEI, Mar 8, 2006
FEI sponsors 2006 safer nano conference
Advanced detection and analysis, coupled with proactive industry education, can pave the way for a future improved by nanomaterials
News from FEI, Mar 7, 2006
Ultra-fast and sensitive SDD detector-based EDS
Quantax Quad features the unique XFlash Quad detector - the first four-channel 40mm2 silicon drift detector (SDD) for energy-dispersive spectroscopy (EDS) systems mounted on electron microscopes
News from Bruker Daltonics, Feb 22, 2006
TEM for high throughput comes to Europe
The PC-controlled H-9500 transmission electron microscope (TEM) from Hitachi High-Technologies is now available in Europe
News from Hitachi High-Technologies, Feb 9, 2006
FEI's Titan S/Tem receives industry honours
Titan scanning transmission electron microscope (S/Tem), the world's most powerful commercially-available microscope, has earned four prestigious awards for its design, performance and innovation
News from FEI, Feb 8, 2006
Anisotropic etching parallel plate plasma etcher
Designed for removal of passivation layer from an electronic device, and when the lines are below a certain point in width, such that undercutting with isotropic etching undercuts the lines completely
News from SPI Supplies, Jan 5, 2006
Osmium coating for electron microscopy
SPI Supplies is the worldwide distributor (outside of Japan) for the line of OPC Osmium Plasma Coaters manufactured by Filgen, an important and respected scientific instrument manufacturer in Japan
News from SPI Supplies, Jan 4, 2006
MRam manufacturers turning towards laser 3DAP
Developers of magnetoresistive random access memory are taking a interest in the Laser Three Dimensional Atom Probe from Oxford Nanoscience to show atomic level structure in these complex devices
News from Oxford Nanoscience, Dec 22, 2005
Molecular imaging acquired by Agilent
Acquisition marks the next step in strengthening Agilent's market position in nanomeasurement by extending its portfolio into imaging at the nanometer scale through atomic force microscopes (AFMs)
News from Molecular Imaging, Nov 30, 2005
New secondary electron detector for S-3400N
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope
News from Hitachi High-Technologies, Nov 14, 2005
Greater sampling volume for 3D atom probe
Field of view has been increased by approximately 2.5 times compared to previous versions of the instrument, without sacrificing mass resolution
News from Oxford Nanoscience, Nov 14, 2005
3DAP wins another award
Three-Dimensional Atom Probe (3DAP) from Oxford Nanoscience has been announced as the winner of the product category of the annual Nano 50 Awards, presented by Nanotech Briefs magazine
News from Oxford Nanoscience, Oct 25, 2005
TEM demonstration system in the UK
Hitachi High-Technologies has announced that the H-7650 ultra-high sensitivity digital imaging TEM is available for demonstration at its Wokingham demonstration unit from the end of September 2005
News from Hitachi High-Technologies, Oct 11, 2005
Scanning atom probe is under development
Next-generation instrument, developed through a DTi-funded Link project, will be used to correlate microstructural properties of the thin films with magnetic and transport device-level performance
News from Oxford Nanoscience, Sep 7, 2005
High temperature accessory for Stem
Specimen holder for high resolution scanning transmission electron microscope enables atomic behaviour of materials at high temperatures to be examined
News from Hitachi High-Technologies, Aug 9, 2005
Sputter profiling for SEM surface analysis
Faraday Plate Imaging package as an optional extra to supplement ion gun component package enables users to identify precisely where the sample is being sputtered
News from Thermo Electron (microanalysis), Jul 18, 2005
Probes for scanning electrochemical microscope
Innovative design of the scanning head coupled with the enhanced specifications of the bi-potentiostat has made this the instrument of choice for some of the top research laboratories around the world
News from Trogone Instruments, Jun 17, 2005
Five-segment BSD for variable pressure SEM
High sensitivity allows smaller spot sizes and beam currents to be used in BSD imaging leading to improved resolution and lower risk of beam damage on delicate, uncoated specimens
News from Hitachi High-Technologies, May 23, 2005
X-ray detector delivers unique thin film analysis
Microbeam X-ray fluorescence metrology systems enable an unprecedented level of analysis for thin film applications in the semiconductor and microelectronics industries
News from Thermo Electron (microanalysis), May 20, 2005
Laser boosts atom probe power
Technology allows the evaporation, counting, identification and spatial location of individual atoms in a semiconductor sample to produce a three-dimensional visualisation of the atomic arrangement
News from Oxford Nanoscience, May 9, 2005
Why use a Stem and not a Tem?
Two new application notes for scanning transmission electron microscopy compare the performance of Stem and Tem instruments, and consider microanalysis with nanometre spatial resolution
News from Hitachi High-Technologies, Apr 18, 2005
Atom probe is highly sensitive
The extremely narrow peaks produced and high signal-to-noise ratio allow accurate chemical analysis of complex alloys
News from Oxford Nanoscience, Apr 18, 2005
Breaking electron microscopy resolution barriers
This in-lens scanning electron microscope claims previously unobtainable resolutions of 0.4nm at 30kV and 1.6nm at 1kV
News from Hitachi High-Technologies, Mar 10, 2005
Not what you're looking for? Search the site.
Featured articles
-
Graphene support films enable TEM characterisation
Electron Microscopy Sciences has announced the addition of graphene transmission electron microscope support films to its product line.
-
FEI installs S/TEM microscope at MAI laboratory
FEI has announced the completion of a multiple system installation at the Materials Ageing Institute (MAI) in France.
Browse by category
- Analytical instruments (9798)
- Chemical analysis equipment (731)
- Chromatographs: gas (251)
- Chromatographs: liquid, ion, gel, HPLC (470)
- Chromatography accessories (566)
- Gas analysis equipment (235)
- pH and conductivity meters (113)
- Cameras and imaging systems (907)
- Electron microscopy systems (242)
- Optical microscopes (498)
- Microscope supplies and accessories (609)
- Mass spectrometers (491)
- Spectroscopy (610)
- Other analytical instruments (630)
- Particle size analysis equipment (658)
- Microplate readers (45)
- Temperature, pressure and flow measurement (271)
- Spectrophotometers (299)
- Titration equipment (837)
- Ultrasound equipment and ultrasonic spectroscopy (118)
- Viscometers and rheometers (368)
- Oscilloscopes (85)
- Mechanical testing equipment (513)
- Test and calibration instrumentation (225)
- Life sciences and clinical laboratory equipment (4006)
- Computer hardware (853)
- Industry news (20)
- Laboratory equipment and wares (6545)
- Laboratory supplies and consumables (1389)
- Pumps, Valves, Filters (759)
- Services (3277)
- Computer software (3071)
