Electron microscopy systems
(a sub category of Analytical instruments)
A - Z list of suppliers
Click on a letter below to find a supplier...
Latest articles from 'Electron microscopy systems'
News releases from this sub-category
Showing 201-225 of 243 articles
Breaking electron microscopy resolution barriers
This in-lens scanning electron microscope claims previously unobtainable resolutions of 0.4nm at 30kV and 1.6nm at 1kV
News from Hitachi High-Technologies, Mar 10, 2005
New head for process development and applications
Peter Clifton joins Oxford Nanoscience from Seagate Technology, where he had been responsible for a variety of sensor development and process development projects
News from Oxford Nanoscience, Feb 18, 2005
Improved display facilities for VPSEM
The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.
News from Hitachi High-Technologies, Feb 8, 2005
Half a century of scanning electron microscopy
Achievements of Cambridge University engineering department and the Cambridge Instrument Company, now Carl Zeiss SMT, are commemorated at Cambridge Philosophical Society meeting
News from Carl Zeiss, Dec 24, 2004
First atom probe sale in China
Instrument provides materials scientists with the ability to simultaneously determine the spatial position and chemical identity of individual atoms in conducting materials
News from Oxford Nanoscience, Dec 16, 2004
Atom probe wins measurement award
The 3DAP was developed in the materials department of Oxford University by Professors Alfred Cerezo and George Smith, and is now available as a commercial instrument
News from Oxford Nanoscience, Dec 9, 2004
TEM has ultra-high sensitivity
This ultra-high sensitivity digital imaging transmission electron microscope offers sensitivity approximately 40 times greater than can be obtained using conventional film
News from Hitachi High-Technologies, Nov 23, 2004
VPSEM promises outstanding performance
Variable pressure scanning electron microscope has new electron optics, detector, pumping system and enhanced sample handling and analysis capabilities
News from Hitachi High-Technologies, Oct 12, 2004
Sales of 3D atom probes to Japan
Oxford Nanoscience announces continuing success in the sale of its 3DAP thtree-dimensional atom probes into Japan
News from Oxford Nanoscience, Oct 12, 2004
Catalysis cell for 3D atom probe
Oxford Nanoscience has announced the availability of a new accessory for the 3DAP three-dimensional atom probe
News from Oxford Nanoscience, Sep 1, 2004
Versatility in microscopy analysis
Instrument claims outstanding analysis capabilities on field emission variable pressure scanning electron microscope
News from Hitachi High-Technologies, Aug 13, 2004
Award for new direction in atomic force microscopy
Said to be the only commercially available instrument to add real-time, simultaneous topography and recognition imaging capability to the atomic force microscope
News from Molecular Imaging, Aug 2, 2004
Nanometre spatial resolution with Stem
Scanning transmission electron microscope offers outstanding mapping and analysis through electron energy loss spectroscopy or energy dispersive X-ray systems
News from Hitachi High-Technologies, Jul 29, 2004
X-ray microanalysis improvements
New products and software introduce significant advancements for analytical methods and dramatically improve laboratory productivity, says company.
News from Thermo Electron (microanalysis), Jul 29, 2004
Electron microscope for protein research
Desktop instrument provides high resolution direct observation of protein preparations in native state, particularly useful for membrane protein preparations
News from Delong Instruments, Jul 7, 2004
Breakthrough in Fesem technology
Instrument combines large sample handling capabilities with the image resolution normally associated with in-lens scanning electron microscopes
News from Hitachi High-Technologies, Jun 28, 2004
Three-dimensional atom probe on show
Technique provides materials characterisation capabilities with the resolution needed to investigate nanostructured materials in order to understand and control their properties
News from Oxford Nanoscience, Jun 28, 2004
Nanotechnology boosts company flotation
Three-dimensional atom probe system offers unique materials characterisation capabilities by allowing both visualisation and analysis of materials at the atomic scale
News from Oxford Nanoscience, May 24, 2004
Resolution improvement by 30% for Fesem
Beam deceleration technology offers even better resolution capabilities at low accelerating voltages for field emission scanning electron microscope
News from Hitachi High-Technologies, May 21, 2004
3D imaging at the nanoscale
Three-dimensional atomic probe imaging with chemical identification boosts materials characterisation at the nanoscale level
News from Oxford Nanoscience, Apr 1, 2004
New man behind the electron microscope
Takes over responsibility for all electron microscope demonstrations, applications work and training
News from Hitachi High-Technologies, Mar 19, 2004
Stem offers improved resolution
New scanning transmission electron microscope provides the capability for real-time element mapping with 2nm spatial resolution
News from Hitachi High-Technologies, Feb 2, 2004
Precision stage for AFM imaging
Extremely accurate positioning stage designed for use in surface characterisation of large samples under atomic force microscopy
News from Molecular Imaging, Dec 15, 2003
TEM reaches 300kV in three minutes
High performance tunelling electron microscope uses a single crystal LaB6 electron source and offers 0.102nm crystal lattice resolution and 0.18nm point to point resolution
News from Hitachi High-Technologies, Nov 4, 2003
Personal SEM in a box
Powerful yet cost effective 'personal' scanning electron microscope packed with features normally only found on top-of-the-range models
News from Jencons-PLS, Oct 29, 2003
Not what you're looking for? Search the site.
Featured articles
-
Asylum awards grants for Band Excitation research
Asylum Research has announced eight grants for early adopters to explore the capabilities and applications of the Band Excitation (BE) technique.
-
Graphene support films enable TEM characterisation
Electron Microscopy Sciences has announced the addition of graphene transmission electron microscope support films to its product line.
Browse by category
- Analytical instruments (9827)
- Chemical analysis equipment (734)
- Chromatographs: gas (252)
- Chromatographs: liquid, ion, gel, HPLC (471)
- Chromatography accessories (567)
- Gas analysis equipment (235)
- pH and conductivity meters (113)
- Cameras and imaging systems (910)
- Electron microscopy systems (245)
- Optical microscopes (499)
- Microscope supplies and accessories (612)
- Mass spectrometers (491)
- Spectroscopy (613)
- Other analytical instruments (631)
- Particle size analysis equipment (662)
- Microplate readers (45)
- Temperature, pressure and flow measurement (271)
- Spectrophotometers (299)
- Titration equipment (840)
- Ultrasound equipment and ultrasonic spectroscopy (118)
- Viscometers and rheometers (369)
- Oscilloscopes (85)
- Mechanical testing equipment (514)
- Test and calibration instrumentation (225)
- Life sciences and clinical laboratory equipment (4021)
- Computer hardware (854)
- Industry news (20)
- Laboratory equipment and wares (6566)
- Laboratory supplies and consumables (1395)
- Pumps, Valves, Filters (760)
- Services (3292)
- Computer software (3080)
