Product category:
Electron microscopy systems
News Release from: AP Technologies | Subject: 3Max detector
Edited by the Laboratorytalk Editorial
Team on 05 January 2007
New capabilities for scanning electron
microscopes
AP Technologies announces the new 3Max detector from El-Mul Technologies of Yavne, Israel, described as the first true innovation in Everhart-Thornley (ET) type chamber detectors in over 40 years
High-end scanning electron microscope (SEM) instruments use in-lens detectors that can greatly reduce the effective secondary electron (SE) signal available for a conventional ET chamber detector due to SE-trapping field configurations This has meant that in many instances the ETD is only used for navigation at the beginning of the SEM study
This article was originally published on Laboratorytalk on 24 May 2002 at 8.00am (UK)
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El-Mul's 3Max detector brings new life to the ET concept by significantly improving the SE signal response as well as collecting SE3-electrons originating from the sample as BSE and converted to SE on the chamber walls and pole piece.
The patent-pending 3Max electrode arrangement captures SE3 electrons from a large range of positions - dramatically increasing the signal-to-noise ratio attainable with an ETD in difficult imaging conditions.
3Max images also reveal more material contrast than a conventional ETD and can, in some cases, eliminate the need for a separate BSE detector.
3Max occupies the standard ET port for easy upgrades and allows instruments to be upgraded in the field.
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