2D detector for demanding X-ray diffraction jobs

Edited by the Laboratorytalk editorial team Mar 22, 2005

Further advancing the limits of X-ray diffraction technology for research applications in materials science by combining the advantages of gaseous detectors with the benefits of solid state detectors

Bruker AXS announces the Vantect-2000, described as a cutting-edge high-performance two-dimensional (2D) X-ray detector based on patented innovative MikroGap technology, for demanding X-ray diffraction (XRD) applications in advanced materials research.

The Vantect-2000 is based on the same technology as Bruker AXS's one-dimensional Vantect-1 detector, which was introduced in 2003.

Because of its high speed measurement capability with no compromise in angular resolution, the Vantect-1 has become hugely successful with more than 80 customer installations worldwide within the last twelve months, says the company.

With the introduction of the Vantect-2000, Bruker AXS says it is advancing the limits of X-ray diffraction technology for research applications in materials science one step further.

The Vantect-2000 features the proprietary MikroGap technology to achieve a 14x14cm2 active area, with spatial resolution of 70um and an unprecedented dynamic range of 108.

The Vantect-2000 is described as combining all the advantages of gaseous detectors with the benefits of solid state detectors.

Its unique technology allows the realisation of almost completely noise-free detectors which are unique in terms of robustness, resolution, sensitivity and dynamic range.

In addition, with its real-time data display and true photon counting capabilities, the Vantect-2000 is the ideal detector for non-destructive nanotechnology investigations by X-ray diffraction, says Bruker.

It improves data quality in applications such as small-angle X-ray scattering (Saxs), thin film investigations and micro-XRD analysis, ie in very demanding applications where the scattered X-ray signal is weak, a high dynamic range needs to be covered, and highest resolution is crucial.

Frank Burgaezy, global XRD business manager for Bruker AXS, commented: "We are proud to introduce our new Vantect-2000 detector to the materials research community.

"This novel detector will push the forefront of research in materials science and will significantly improve throughput and reliability for industrial X-ray diffraction applications.

"The Vantect-2000 is simply redefining the limits of high-performance XRD.