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Bruker AXS Microanalysis
Address:
1239 Parkway Ave
Ewing, NJ
08628
USA
http://www.bruker-axs.com
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Listing of all 19 news releases from Bruker AXS Microanalysis:
Bruker AXS launches G4 Phoenix at Fabtech 2008
Bruker AXS will launch its G4 Phoenix combustion analysis system at the Fabtech International and AWS Welding Show 2008, in Las Vegas, US, on 6-8 October. Brochure available
News from Bruker AXS Microanalysis ( 7 October 2008)
Bruker AXS closes acquisition, exhibits products
Bruker AXS has announced the closure of its acquisition of Surface Imaging Systems (SIS) and revealed that its AFM products will be exhibited at the European Microscopy Congress. Brochure available
News from Bruker AXS Microanalysis ( 3 September 2008)
Bruker unveils handheld XRF
Bruker AXS will present its TRACERturboSD, a handheld X-ray Fluorescence (XRF) instrument with a silicon drift detector (SDD), at the Stainless Steel World Conference in Texas, 9-10 September. Brochure available
News from Bruker AXS Microanalysis (28 August 2008)
Bruker introduces Quantax Crystalign and XFlash
Bruker AXS Microanalysis has chosen the Microscopy and Microanalysis 2008 annual meeting to unveil several products and options for scanning electron microscope (SEM) based materials analysis. Brochure available
News from Bruker AXS Microanalysis (13 August 2008)
Goldstein takes 2008 Duncumb microanalysis award
Bruker AXS, in cooperation with The Microbeam Analysis Society, announces this year's winner of the Duncumb award for excellence in microanalysis as Joseph Goldstein of the University of Massachusetts Brochure available
News from Bruker AXS Microanalysis ( 6 August 2008)
Drift detectors resolve at ultra-high energy
Bruker AXS Microanalysis presented the XFlash 5000 series of liquid nitrogen free XFlash silicon drift detectors (SDD) for use with its Quantax microanalysis systems Brochure available
News from Bruker AXS Microanalysis ( 6 August 2008)
Bruker AXS Microanalysis introduces EBSD system
Bruker AXS Microanalysis will introduce Quantax CrystAlign system for SEM-based crystallographic analysis via electron backscatter diffraction (EBSD) at Microscopy and Microanalysis (M+M) 2008 Brochure available
News from Bruker AXS Microanalysis (31 July 2008)
Automated chemical crystallography wins R+D award
Bruker AXS's Smart X2S automated chemical X-ray crystallography system has been awarded a R+D 100 award, recognising it as one of the 100 most technologically significant products of the past year Brochure available
News from Bruker AXS Microanalysis (25 July 2008)
Variable counting time is gold standard for X-ray
Bruker AXS announces XRDWizard V2.9 support for Variable Counting Time (VCT) data collection for X-ray powder diffraction, where the measurement time is systematically increased to high 2theta angles Brochure available
News from Bruker AXS Microanalysis ( 7 July 2008)
World's first handheld XRF with silicon drift
The revolutionary TracerturboSD with integrated Silicon Drift Detector (SDD) offers unparalleled speed, sensitivity and energy resolution, previously found only in more expensive laboratory systems Brochure available
News from Bruker AXS Microanalysis (30 June 2008)
Complementary technologies make a business fit
Bruker AXS and mineral analysis technology company Intellection have announced a new strategic collaboration agreement which builds on the strong existing OEM relationship between the companies Brochure available
News from Bruker AXS Microanalysis (22 April 2008)
Bruker AXS buys Juwe Laborgeraete
Juwe initially provided service and support for the large installed base of Stroehlein systems, and in 2004 launched a new generation of Juwe-branded combustion analysis systems Brochure available
News from Bruker AXS Microanalysis ( 4 January 2008)
$6000 X-ray diffraction scholarship awarded
Bruker AXS has announced the recipient of its 2007 Excellence in X-ray Diffraction (XRD) scholarship - based on unique experiments performed by university students Brochure available
News from Bruker AXS Microanalysis (30 November 2007)
X-ray beam made over 30 times brighter
The intensity of the Microstar Ultra II, the newest version of the Microstar Ultra ultra-bright X-ray source for structural biology, surpasses many second-generation synchrotron beam lines Brochure available
News from Bruker AXS Microanalysis (20 November 2007)
Benchtop X-ray crystallography offers 3D benefits
Bruker AXS has launched its compact SMART X2S (Crystal-to-Structure), the first benchtop X-ray crystallography system for fully automated three-dimensional (3D) chemical structure determination Brochure available
News from Bruker AXS Microanalysis (21 August 2007)
Versatile small molecule X-ray crystallography
Bruker AXS announced the launch of the Apex Duo, the first single crystal diffractometer to feature instantaneous and automated X-ray wavelength change, at the American Crystallographic Association Brochure available
News from Bruker AXS Microanalysis (25 July 2007)
First Duncumb award for microanalysis excellence
Bruker AXS, in cooperation with the the Microbeam Analysis Society, announces the creation of the Duncumb Award for Excellence in Microanalysis; first winner is David Williams of Lehigh University Brochure available
News from Bruker AXS Microanalysis ( 4 April 2007)
Ultra-bright X-ray source for structural biology
At Pittcon 2007, Bruker AXS introduced its Microstar Ultra, an ultra-bright X-ray source for structural biology said to be the most intense home laboratory X-ray source available Brochure available
News from Bruker AXS Microanalysis ( 8 March 2007)
Silicon drift detector has 125eV at 100,000cps
The LN2 free XFlash 4010 features 125 eV energy resolution at over 100,000 counts per second, making it the highest resolution X-ray spectroscopy and microanalysis detector available Brochure available
News from Bruker AXS Microanalysis (18 January 2007)
