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    <pubDate>Fri, 25 Apr 2008 08:00:00 UT</pubDate>
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      <title>Materials microscope has scanning optical imaging</title>
      <description>CTZ101 can be upgraded to include increasing levels of automation of all the usual functions to the high level of 0.1micron precision, including measurement capability in all three surface planes</description>
      <pubDate>Mon, 10 Dec 2007 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg109.html</link>
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      <title>Mobile imaging with digital camera microscope</title>
      <description>Varifocal objective lens provides up to 40x magnification at 2cm working distance with a 1cm field depth making it ideal for a wide range of applications from entomology to forensic studies</description>
      <pubDate>Tue, 03 Jul 2007 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg108.html</link>
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      <title>Microscope automation for materials and biology</title>
      <description>Any compound optical microscope can now be computer controlled to provide extended sample scanning where large traverse high resolution digital imaging may be required</description>
      <pubDate>Wed, 18 Oct 2006 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg107.html</link>
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      <title>Lenticuler imaging for microscopy applications</title>
      <description>By using dual computer graphics and a lenticuler monitor any two images can be combined to produce autoscopic three dimensional projections without the need for viewing glasses</description>
      <pubDate>Wed, 19 Jul 2006 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg106.html</link>
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      <title>Oil fluidics shown by matrix time lapse scanning</title>
      <description>Essential requirement in the assessment of the potential economic extraction of oil resources is the visualisation of fluid dynamics within micro-models of core samples from sites under consideration</description>
      <pubDate>Wed, 08 Feb 2006 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg105.html</link>
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      <title>Computer control for any optical microscope</title>
      <description>Any compound optical microscope can now be computer controlled to provide extended sample scanning where large traverse and area high resolution digital imaging may be required</description>
      <pubDate>Mon, 03 Oct 2005 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg104.html</link>
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      <title>Digital camera lenses for microimaging</title>
      <description>Any digital camera or camcorder can now be interfaced to any C-mount or SLR lens, or microscope, by using this coupling lens assembly</description>
      <pubDate>Tue, 21 Jun 2005 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg103.html</link>
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      <title>Mosaic automation gives 10GB microimaging scans</title>
      <description>Considerable extensions in optical, SEM, and TEM performance can be achieved by integrating mosaic imaging software with these instruments</description>
      <pubDate>Fri, 08 Apr 2005 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg102.html</link>
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      <title>Digital imaging archiving offers advantages</title>
      <description>Integral optical zoom provides a real magnification gain of four times over that available in the microscope or macro-lens being used</description>
      <pubDate>Fri, 14 Jan 2005 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg101.html</link>
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      <title>Trace element detection by EDS</title>
      <description>A one hundred times increase in energy dispersive spectrometer analysis sensitivity can be achieved by combining this technique with that of XRF generation</description>
      <pubDate>Mon, 30 Aug 2004 08:00:00 UT</pubDate>
      <category>Cambridge Technology Systems</category>
      <link>http://www.laboratorytalk.com/news/cdg/cdg100.html</link>
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