Product category:
Microscope supplies and accessories
News Release from: Cambridge Technology Systems | Subject: Microscope automation
Edited by the Laboratorytalk Editorial
Team on 18 October 2006
Microscope automation for materials and
biology
Any compound optical microscope can now be computer controlled to provide extended sample scanning where large traverse high resolution digital imaging may be required
Any compound optical microscope can now be computer controlled to provide extended sample scanning where large traverse high resolution digital imaging may be required, through the application of mosaic automation systems to a location accuracy of 0.1 microns Dynamic auto-sensing of focus and correction is also provided for optimum results
This article was originally published on Laboratorytalk on 30 Aug 2004 at 8.00am (UK)
Related stories
Trace element detection by EDS
A one hundred times increase in energy dispersive spectrometer analysis sensitivity can be achieved by combining this technique with that of XRF generation
Also newly available is focus stack integration and multiple point time lapse imaging.
Applications for these techniques include micro-engineering, histology, fluidics, micro-geology and semiconductor diagnostics.
Trial samples are welcomed at the applications laboratory of Cambridge Technology Systems where confidential results can be provided without charge together with system engineering advice if required.
Hardware and software extensions to existing microscopes are available, or alternatively complete systems incorporating a new microscope of the user's choice engineer installation and operator training is also available in support of these systems.
Further information may be obtained by contacting Cambridge Technology Systems.
• Cambridge Technology Systems: contact details and other news
• Email this article to a colleague
• Register for the free Laboratorytalk email newsletter
• Laboratorytalk Home Page
