Product category:
Spectrophotometers
News Release from: Craic Technologies | Subject: QDI 2010 microspectrophotometer
Edited by the Laboratorytalk Editorial
Team on 26 May 2008
Trace detection by ultraviolet
microscopy
Organic and inorganic contaminants of precision devices such as flat panel displays, MEMS devices and patterned semiconductors are often difficult to detect
Many contaminant materials are essentially invisible to common analytical techniques such as optical microscopy Craic Technologies provides the capability to both detect and analyse trace contaminants with a single instrument
This article was originally published on Laboratorytalk on 7 Sep 2007 at 8.00am (UK)
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Images and spectra in the UV, visible, and NIR
QDI ImageUV imaging system enables QDI 2010 microspectrophotometer users to acquire images and spectra in transmittance, reflectance, polarisation and fluorescence from the deep UV to the NIR
Direct visualisation for microspectrophotometers
With direct visualisation, a user can directly view the sample in addition to seeing it on a computer screen
Software for microspectrophotometers
Increased instrument automation and the ability to change more microspectrophotometer parameters while retaining ease of use
This is done by combining both ultraviolet microscopy with ultraviolet microspectroscopy in the Craic Technologies QDI 2010 microspectrophotometer equipped with the optional QDI ImageUV package.
Many organic and inorganic materials absorb light in the ultraviolet region but are invisible to the naked eye.
This means that standard optical microscopy will not be able to detect these contaminants nor is it capable of analysing them.
While other techniques are available, they require extensive sample preparation and can damage the sample.
By utilising ultraviolet micro-imaging, the user is able to quickly, easily and non-destructively locate many contaminants.
UV microspectroscopy can then be performed to measure the electronic spectral characteristics of the contaminant in order to identify it.
The spectra can also be used to further improve the clarity of the image of the contaminants by determining the wavelength of maximum absorbance.
By combining both techniques in the QDI 2010 microspectrophotometer, the user is easily able to locate and identify contaminant materials on flat panel displays, semiconductor chips, Mems and even microfluidic devices.
The QDI 2010 microspectrophotometer is the first system ever to combine both UV microscopy and microspectroscopy in a single tool.
It can also be upgraded to enable ultraviolet, visible and near infrared reflectance, transmittance and fluorescence microscopy and microspectroscopy.
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