Product category:
Optical microscopes
News Release from: Carl Zeiss MicroImaging | Subject: LSM 5 Exciter
Edited by the Laboratorytalk Editorial
Team on 06 August 2007
Highly exact, non-contact surface
measurement
Non-contact confocal technique allows 2D and 3D topographies to be visualised and measured, roughness and waviness determined, and porosity and volume content measured with quality and reliability
With the LSM 5 Exciter laser scanning microscope, Carl Zeiss MicroImaging says it is offering users in materials research and quality analysis a microscope system which also analyzes relatively soft materials such as polymers in a non-contact procedure and with high measuring accuracy and resolution LSM 5 Exciter increases the speed, reliability and convenience of material analysis
This article was originally published on Laboratorytalk on 4 Apr 2003 at 8.00am (UK)
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Special software functions allow the quantitative surface examination and analysis of materials.
The possibility of working both in reflected and fluorescent light expands the flexibility of analytical techniques.
The StitchArt plus option allows extra-long line profiles or image stack arrays extending over the more than eight hundred times the size of the scan field to be captured automatically with variable overlapping areas.
Numerous other automated processes and adjusting functions are an integral part of the StitchArt plus option.
These include, for example, autofocus, automatic contrast and brightness optimization as well as the precise, first-order correction of the objective's residual field curvature.
LSM 5 Exciter is offered in combination with the Axio Imager and Axio Observer microscopes - also with polarisation equipment.
Piezo-technology and nanometer scaling allow fast and exact measurements.
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