Particle size and shape in a single process

A completely new sensor geometry and revolutionary software are the major innovative features of this unique instrument, which will make its debut at Achema

The Fritsch Analysette 22 NanoTec laser particle sizer is said to be the first laser measuring device in the world for the determination of particle size distributions together with recognition of the particle shape in a single process.

A completely new sensor geometry and revolutionary software are the major innovative features of this unique instrument, which will make its debut at Achema 2003.

Among its features are: Extended sub-micron measuring range 10nm to 1000µm.

Scattered light measurement in the range of 0 to 180deg.

Double laser diode for forward and backward directions.

Auto-alignment for both laser beams.

Newly developed scattered light detector.

High-quality optical and mechanical components.

Optical bench in special, low-distortion aluminium alloy.

Modern and complete calculation of Mie theory.

Solution of integral calculus without approximation methods.

Integrated measurement data coverage without additional hardware.

Distributed 16-bit flash processors.

Meets ISO 13320-1.

Dual line measurement.

Wet and dry measurement in a single instrument.

Fully automatic change-over between wet and dry measurements.

Independent wet and dry measurement pathways.

Dead space-free rinsing.

Shape recognition.

Can detect elongation ratios from 4.5 to 0.2.

Intelligent evaluation using neuronal networks.

Particle shape evaluation result available in minutes.

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