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Hitachi High-Technologies

Address:
7 Ivanhoe Road
Hogwood Lane Industrial Estate
Finchampstead
RG40 4QQ
UK
Telephone: (UK) +44 118 932 8632

http://www.hitachi-hitec-uk.com

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Listing of all 59 news releases from Hitachi High-Technologies:

SU6600 is new variable pressure field emission SEM

Hitachi High-Technologies has announced the new SU6600 variable pressure field emission SEM, further increasing its range of high performance electron microscopes

News from Hitachi High-Technologies ( 3 June 2008)

Electron microscopes assist work at British Museum

 User application article   Department of Conservation and Scientific Research at the British Museum has two Hitachi analytical scanning electron microscopes (SEMs), to establish a state of the art electron microscopy facility

News from Hitachi High-Technologies (28 May 2008)

Hitachi expands its electron microscopy range

Hitachi High-Technologies is introducing two new additions to its rapidly expanding range of electron microscopes at Microscience 2008

News from Hitachi High-Technologies (24 April 2008)

Tabletop microscope is kinder to the environment

Hitachi High-Technologies says its TM-1000 tabletop microscope is measurably kinder to the environment than the company's previous entry-level scanning electron microscope

News from Hitachi High-Technologies ( 3 March 2008)

Tabletop microscope performs chemical analysis

The latest development for the highly successful TM-1000 tabletop microscope from Hitachi is the addition of chemical microanalysis by EDX, to create an even more powerful investigation technique

News from Hitachi High-Technologies (14 November 2007)

300kV field emission TEM to be launched at Emag

Hitachi High Technologies says it will make a number of new product announcements at the Emag Exhibition, University of Glasgow, 3-7 September 2007

News from Hitachi High-Technologies (16 July 2007)

VPSEM software simplifies 3D analysis

Software provides an easy-to-use alternative for acquiring 3D information compared to methods that either involve manual tilting of the specimen or electronic tilting of the incident electron beam

News from Hitachi High-Technologies (21 June 2007)

Electron microscope shines at fossil festival

 User application article   Hitachi's TM-1000 tabletop electron microscope proved to be a popular attraction at the recent 'Rising Seas' Lyme Regis Fossil Festival in Dorset, UK

News from Hitachi High-Technologies (24 May 2007)

Global warming put under the microscope, literally

The Rising Seas Lyme Regis Fossil Festival brings together scientific institutions and universities with the local community and will consider issues such as "who is responsible for global warming?"

News from Hitachi High-Technologies (30 April 2007)

High performance Stem has new electron optics

By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens

News from Hitachi High-Technologies (10 January 2007)

Tabletop microscopes on show at Buckingham Palace

Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006

News from Hitachi High-Technologies ( 5 December 2006)

Microscope boost for medical device imaging

Fully expanded stents can be of the order of millimeters in diameter, so the excellent depth of focus of the TM-1000 allows the entire depth of the cylindrical structure to be imaged

News from Hitachi High-Technologies (15 November 2006)

Hitachi contributes to microscopy congress

Representatives will reinforce company's expertise in electron optics by making a significant contribution to the 16th International Microscopy Congress (IMC16) in Sapporo, Japan, 2-8 September 2006

News from Hitachi High-Technologies (18 August 2006)

Large chamber analytical VPSEM launched by Hitachi

S-3700N Variable Pressure scanning electron microscope (VPSEM) has analytical chamber capable of accepting samples up to 300mm across and 11 accessory ports for analytical and experimental equipment

News from Hitachi High-Technologies (14 July 2006)

Launch leads largest ever instrument showing

Microscience 2006 sees the largest ever showing of electron microscopes by Hitachi at a UK show, including a brand new variable pressure analytical scanning electron microscope

News from Hitachi High-Technologies (21 April 2006)

Tabletop microscope as easy as a digital camera

The new TM-1000 tabletop microscope from Hitachi High-Technologies is set to transform the field of basic microscopy

News from Hitachi High-Technologies (10 April 2006)

Expansion of electron microscope sales area

Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes

News from Hitachi High-Technologies (22 March 2006)

TEM for high throughput comes to Europe

The PC-controlled H-9500 transmission electron microscope (TEM) from Hitachi High-Technologies is now available in Europe

News from Hitachi High-Technologies ( 9 February 2006)

New secondary electron detector for S-3400N

Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope

News from Hitachi High-Technologies (14 November 2005)

Autosampling atomic absorption spectrophotometry

A new autosampler has been introduced by Hitachi High-Technologies for the Z-2300 flame-only atomic absorption spectrophotometer

News from Hitachi High-Technologies (25 October 2005)

TEM demonstration system in the UK

Bio-spectrophotometer measures nucleic acids

High temperature accessory for Stem

Five-segment BSD for variable pressure SEM

Why use a Stem and not a Tem?

Breaking electron microscopy resolution barriers

Improved display facilities for VPSEM

Larger stage extends SEM capabilities

TEM has ultra-high sensitivity

VPSEM promises outstanding performance

Versatility in microscopy analysis

Nanometre spatial resolution with Stem

Breakthrough in Fesem technology

Resolution improvement by 30% for Fesem

New man behind the electron microscope

Stem offers improved resolution

TEM reaches 300kV in three minutes

Light at the end of the tunnel

Ultra-high resolution field emission VPSEM

Host of applications for ESE detector

Flash disk first for new spectrophotometer

Spectrophotometer offers wavelength, time scanning

VPSEM for large samples

Preferred quality supplier award

Ultra-high resolution Fesem for large samples

3D scanning software for spectrophotometer

Enhanced backscattered electron detection

High sensitivity fluorescence analysis

Sample preparation for spectrophotometer

Improved scanning electron microscope

A net revolution in electron microscopy

Upgrade package for fluorescence spectrophotometer

DNA measurement and much more

Restructuring at Hitachi

Low cost scanning electron microscope

New autofocus TEM

Automatic fluorescence spectrophotometric assays

New in-lens FESEM

Integrated software for fluorescence instruments

 

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