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Hitachi High-Technologies
Address:
7 Ivanhoe Road
Hogwood Lane Industrial Estate
Finchampstead
RG40 4QQ
UK
Telephone: (UK) +44 118 932 8632
http://www.hitachi-hitec-uk.com
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Listing of all 59 news releases from Hitachi High-Technologies:
SU6600 is new variable pressure field emission SEM
Hitachi High-Technologies has announced the new SU6600 variable pressure field emission SEM, further increasing its range of high performance electron microscopes
News from Hitachi High-Technologies ( 3 June 2008)
Electron microscopes assist work at British Museum
User application article Department of Conservation and Scientific Research at the British Museum has two Hitachi analytical scanning electron microscopes (SEMs), to establish a state of the art electron microscopy facility
News from Hitachi High-Technologies (28 May 2008)
Hitachi expands its electron microscopy range
Hitachi High-Technologies is introducing two new additions to its rapidly expanding range of electron microscopes at Microscience 2008
News from Hitachi High-Technologies (24 April 2008)
Tabletop microscope is kinder to the environment
Hitachi High-Technologies says its TM-1000 tabletop microscope is measurably kinder to the environment than the company's previous entry-level scanning electron microscope
News from Hitachi High-Technologies ( 3 March 2008)
Tabletop microscope performs chemical analysis
The latest development for the highly successful TM-1000 tabletop microscope from Hitachi is the addition of chemical microanalysis by EDX, to create an even more powerful investigation technique
News from Hitachi High-Technologies (14 November 2007)
300kV field emission TEM to be launched at Emag
Hitachi High Technologies says it will make a number of new product announcements at the Emag Exhibition, University of Glasgow, 3-7 September 2007
News from Hitachi High-Technologies (16 July 2007)
VPSEM software simplifies 3D analysis
Software provides an easy-to-use alternative for acquiring 3D information compared to methods that either involve manual tilting of the specimen or electronic tilting of the incident electron beam
News from Hitachi High-Technologies (21 June 2007)
Electron microscope shines at fossil festival
User application article Hitachi's TM-1000 tabletop electron microscope proved to be a popular attraction at the recent 'Rising Seas' Lyme Regis Fossil Festival in Dorset, UK
News from Hitachi High-Technologies (24 May 2007)
Global warming put under the microscope, literally
The Rising Seas Lyme Regis Fossil Festival brings together scientific institutions and universities with the local community and will consider issues such as "who is responsible for global warming?"
News from Hitachi High-Technologies (30 April 2007)
High performance Stem has new electron optics
By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improved resolution and analytical sensitivity, enabling atomic level imaging on many specimens
News from Hitachi High-Technologies (10 January 2007)
Tabletop microscopes on show at Buckingham Palace
Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006
News from Hitachi High-Technologies ( 5 December 2006)
Microscope boost for medical device imaging
Fully expanded stents can be of the order of millimeters in diameter, so the excellent depth of focus of the TM-1000 allows the entire depth of the cylindrical structure to be imaged
News from Hitachi High-Technologies (15 November 2006)
Hitachi contributes to microscopy congress
Representatives will reinforce company's expertise in electron optics by making a significant contribution to the 16th International Microscopy Congress (IMC16) in Sapporo, Japan, 2-8 September 2006
News from Hitachi High-Technologies (18 August 2006)
Large chamber analytical VPSEM launched by Hitachi
S-3700N Variable Pressure scanning electron microscope (VPSEM) has analytical chamber capable of accepting samples up to 300mm across and 11 accessory ports for analytical and experimental equipment
News from Hitachi High-Technologies (14 July 2006)
Launch leads largest ever instrument showing
Microscience 2006 sees the largest ever showing of electron microscopes by Hitachi at a UK show, including a brand new variable pressure analytical scanning electron microscope
News from Hitachi High-Technologies (21 April 2006)
Tabletop microscope as easy as a digital camera
The new TM-1000 tabletop microscope from Hitachi High-Technologies is set to transform the field of basic microscopy
News from Hitachi High-Technologies (10 April 2006)
Expansion of electron microscope sales area
Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes
News from Hitachi High-Technologies (22 March 2006)
TEM for high throughput comes to Europe
The PC-controlled H-9500 transmission electron microscope (TEM) from Hitachi High-Technologies is now available in Europe
News from Hitachi High-Technologies ( 9 February 2006)
New secondary electron detector for S-3400N
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope
News from Hitachi High-Technologies (14 November 2005)
Autosampling atomic absorption spectrophotometry
A new autosampler has been introduced by Hitachi High-Technologies for the Z-2300 flame-only atomic absorption spectrophotometer
News from Hitachi High-Technologies (25 October 2005)
TEM demonstration system in the UK
Bio-spectrophotometer measures nucleic acids
High temperature accessory for Stem
Five-segment BSD for variable pressure SEM
Breaking electron microscopy resolution barriers
Improved display facilities for VPSEM
Larger stage extends SEM capabilities
TEM has ultra-high sensitivity
VPSEM promises outstanding performance
Versatility in microscopy analysis
Nanometre spatial resolution with Stem
Breakthrough in Fesem technology
Resolution improvement by 30% for Fesem
New man behind the electron microscope
Stem offers improved resolution
TEM reaches 300kV in three minutes
Light at the end of the tunnel
Ultra-high resolution field emission VPSEM
Host of applications for ESE detector
Flash disk first for new spectrophotometer
Spectrophotometer offers wavelength, time scanning
Preferred quality supplier award
Ultra-high resolution Fesem for large samples
3D scanning software for spectrophotometer
Enhanced backscattered electron detection
High sensitivity fluorescence analysis
Sample preparation for spectrophotometer
Improved scanning electron microscope
A net revolution in electron microscopy
Upgrade package for fluorescence spectrophotometer
Low cost scanning electron microscope
Automatic fluorescence spectrophotometric assays
Integrated software for fluorescence instruments
