Product category:
Electron microscopy systems
News Release from: Hitachi High-Technologies | Subject: H-9500 TEM
Edited by the Laboratorytalk Editorial
Team on 04 November 2003
TEM reaches 300kV in three minutes
High performance tunelling electron microscope uses a single crystal LaB6 electron source and offers 0.102nm crystal lattice resolution and 0.18nm point to point resolution
The new PC-controlled H-9500 TEM from Hitachi High-Technologies is designed for rapid operation With specimen changes in around one minute and a stable electron beam at 300 kV within just three minutes, the instrument is ready for use in less than five minutes
This article was originally published on Laboratorytalk on 10 Jul 2001 at 8.00am (UK)
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The new H-9500 is a high performance TEM which uses a single crystal LaB6 electron source and offers 0.102nm crystal lattice resolution and 0.18nm point to point resolution.
Utilising the Windows 2000 operating system, the H-9500 has a simple icon-driven user interface.
In addition to providing a host of automatic functions, the system allows up to 20 sets of operating conditions (lens settings, accelerating voltage etc) to be saved for easy recall.
Comprehensive measurement facilities including point to point measurement and caliper measurement functions are also included.
The microscope is equipped with a high resolution (1K x 1K pixel) CCD camera with fast or slow scan functions for direct recording of high quality digital images.
Naturally images can also be recorded on film in the conventional way.
The instrument features its own image database which allows images to be reviewed through a thumbnail display.
A photo log file stores a host of information including the operating conditions and even the stage co-ordinates for the image.
Using this stored data it is possible to view the same specimen positions simply by recalling the specimen stage coordinates.
In order to allow the operator to immediately see which areas of the specimen have been examined and which have not, a specimen position trace function has been provided.
This enables movement of the specimen stage to be tracked and shown on the graphical display.
Coordinates may be stored at any position along the movement path.
The H-9500 offers great flexibility for multi-technique investigations.
Specimen holders are available which are completely interchangeable with the FB-2100 focused ion beam instrument and the new HD-2300 STEM.
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