Product category:
Electron microscopy systems
News Release from: Hitachi High-Technologies | Subject: S-5500
Edited by the Laboratorytalk Editorial
Team on 10 March 2005
Breaking electron microscopy resolution
barriers
This in-lens scanning electron microscope claims previously unobtainable resolutions of 0.4nm at 30kV and 1.6nm at 1kV
Hitachi High-Technologies has announced the launch of the S-5500, a new addition to its range of Fesems which brings the world's highest resolution for an scanning electron microscope (SEM) This in-lens scanning electron microscope claims previously unobtainable resolutions of 0.4nm at 30kV and 1.6nm at 1kV
This article was originally published on Laboratorytalk on 10 Jul 2001 at 8.00am (UK)
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The in-lens configuration not only provides unparalleled resolution but is also fully compatible with EDX detectors, and offers high EDX sensitivity.
EDX analysis and imaging can be carried out without changing specimen position.
Hitachi's patented Super ExB energy filter enhances signal collection efficiency and allows the secondary and backscattered electron contributions to the image to be optimised.
A brand new intelligent graphical user interface has been combined with a large LCD monitor to enables crisp, high quality images to be produced quickly and easily.
A simple mode selection makes it easy to switch between high resolution imaging and EDX analysis operating conditions.
The S-5500 can be linked to the PCI database for web-enabled microscopy.
The microscope's side-entry specimen stage has excellent stability and provides smooth motion at even the highest magnifications.
A wide variety of specimen holders are available for a host of different sample types and applications.
These include cross-sections, transmission specimens, rotating samples and cryo-specimens.
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