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Jeol USA
Address:
11 Dearborn Road
Peabody, Massachusetts
01960
USA
http://www.jeolusa.com
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Listing of all 20 news releases from Jeol USA:
Jeol Introduces new thermal FE-SEM at M+M
Jeol USA will demonstrate a new high throughput thermal field emission (FEG) scanning electron microscope (SEM), the JSM-7600F, at M+M 2008 in Albuquerque, New Mexico, USA
News from Jeol USA ( 4 August 2008)
FE multibeam added to Jeol's SEM/FIB lineup
Jeol USA will demonstrate both of its new multibeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam 'power tools' at M+M 2008
News from Jeol USA ( 1 August 2008)
Remote microscopy demonstrated at M+M 2008
From the exhibition hall in Albuquerque, Jeol USA will demonstrate via remote operation three of its more than 30 TEMs currently using Sirius Remote TEM software and internet or wireless connections
News from Jeol USA ( 1 August 2008)
Software enhances TEM imaging and data acquisition
Jeol will demonstrate a variety of new software packages for its 120kV to 300kV series of transmission electron microscopes (TEMs) at M+M 2008 Microscopy and Microanalysis in Albuquerque, 4-7 August
News from Jeol USA (31 July 2008)
Tutorial for practical remote in situ microscopy
Jeol USA will host a tutorial session at M+M 2008 in conjunction with Oak Ridge National Laboratory (ORNL) and Protochips to introduce Prism - practical remote in situ microscopy
News from Jeol USA (30 July 2008)
Applications notebook for Accutof-Dart mass spec
Jeol USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry
News from Jeol USA (15 May 2008)
Nikon and Jeol launch NeoScope benchtop SEM
NeoScope, targeted at the bioscience research and industrial inspection communities, fills the optical microscopist's need for advanced imaging capability that is both affordable and easy to use.
News from Jeol USA ( 4 March 2008)
Boeckeler to distribute Jeol sample prep tool
Boeckeler's RMC products division of Tucson, Arizona, a manufacturer of microtomes for sample preparation, will act as distributor for Jeol's unique sample preparation tool, the Cross Section Polisher
News from Jeol USA (25 February 2008)
Technology in education of reintegrated scientist
User application article Boston College has selected the new Jeol MultiBeam focused ion beam system and a field emission scanning electron microscope for its nanofabrication clean room facility in Newton, Massachusetts
News from Jeol USA (18 January 2008)
Scanning electron microscope is 'portable'
The new CarryScope is described as the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene
News from Jeol USA ( 9 January 2008)
Electron microscopes score three hits at USC
User application article University of Southern California (USC) has purchased three electron microscopes from Jeol USA for its new Center of Excellence for Nano-Imaging in Los Angeles, California
News from Jeol USA ( 5 October 2007)
New high-sensitivity NMR spectrometer goes on show
JEOL USA is introducing its new compact, high-performance ECS-400 400MHz NMR spectrometer featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet
News from Jeol USA ( 9 August 2007)
JEOL introduces new high sensitivity FT-NMR
JEOL USA has introduced a new, high-stability FT-NMR spectrometer that is fully automated and network cyber-enabled, adaptable to a many-to-many communication paradigm
News from Jeol USA ( 7 August 2007)
'Super microprobe' installation completed at Nist
User application article Jeol JXA-8500F is a unique type of electron microscope with analytical ability said to surpass that of even the most advanced scanning electron microscopes (SEM) available today
News from Jeol USA ( 6 August 2007)
Mass spec applications booklet now in 3rd edition
The AccuTof time-of-flight mass spectrometer provides exact masses and accurate isotopic abundances that can be used to confirm sample composition or determine the elemental composition of unknowns
News from Jeol USA (27 June 2007)
Seventh consecutive Omega award for service
For the seventh consecutive year, Jeol USA has received the Omega NorthFace Scoreboard award in recognition of its commitment to providing exemplary service and exceeding customer expectations
News from Jeol USA (10 May 2007)
Brain imaging in 3D at high resolution
Technical background article Researchers at Harvard University's department of molecular and cellular biology have selected Jeol as a partner in a collaborative effort to map the brain using high resolution SEM images
News from Jeol USA (30 April 2007)
Pet food testing method is a 'breakthrough'
Technical background article A professor and graduate student in University of the Pacific's chemistry department have developed a new method for determining how to identify foreign substances in pet food
News from Jeol USA (26 April 2007)
Jeol Technics ships 10,000th electron microscope
User application article Jeol Technic, one of Jeol USA's design and manufacturing branches in Akashima, Japan, has shipped its 10,000th scanning electron microscope (SEM)
News from Jeol USA (30 March 2007)
Six awards in six years
For the sixth consecutive year, Jeol USA has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations
News from Jeol USA (13 September 2006)
