Latest news on Laboratorytalk categorised by supplier

Jeol USA

Address:
11 Dearborn Road
Peabody, Massachusetts
01960
USA

http://www.jeolusa.com

Our RSS feed for news from Jeol USA

Request to receive our free email newsletter each week

 

Listing of all 20 news releases from Jeol USA:

Jeol Introduces new thermal FE-SEM at M+M

Jeol USA will demonstrate a new high throughput thermal field emission (FEG) scanning electron microscope (SEM), the JSM-7600F, at M+M 2008 in Albuquerque, New Mexico, USA

News from Jeol USA ( 4 August 2008)

FE multibeam added to Jeol's SEM/FIB lineup

Jeol USA will demonstrate both of its new multibeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam 'power tools' at M+M 2008

News from Jeol USA ( 1 August 2008)

Remote microscopy demonstrated at M+M 2008

From the exhibition hall in Albuquerque, Jeol USA will demonstrate via remote operation three of its more than 30 TEMs currently using Sirius Remote TEM software and internet or wireless connections

News from Jeol USA ( 1 August 2008)

Software enhances TEM imaging and data acquisition

Jeol will demonstrate a variety of new software packages for its 120kV to 300kV series of transmission electron microscopes (TEMs) at M+M 2008 Microscopy and Microanalysis in Albuquerque, 4-7 August

News from Jeol USA (31 July 2008)

Tutorial for practical remote in situ microscopy

Jeol USA will host a tutorial session at M+M 2008 in conjunction with Oak Ridge National Laboratory (ORNL) and Protochips to introduce Prism - practical remote in situ microscopy

News from Jeol USA (30 July 2008)

Applications notebook for Accutof-Dart mass spec

Jeol USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry

News from Jeol USA (15 May 2008)

Nikon and Jeol launch NeoScope benchtop SEM

NeoScope, targeted at the bioscience research and industrial inspection communities, fills the optical microscopist's need for advanced imaging capability that is both affordable and easy to use.

News from Jeol USA ( 4 March 2008)

Boeckeler to distribute Jeol sample prep tool

Boeckeler's RMC products division of Tucson, Arizona, a manufacturer of microtomes for sample preparation, will act as distributor for Jeol's unique sample preparation tool, the Cross Section Polisher

News from Jeol USA (25 February 2008)

Technology in education of reintegrated scientist

 User application article   Boston College has selected the new Jeol MultiBeam focused ion beam system and a field emission scanning electron microscope for its nanofabrication clean room facility in Newton, Massachusetts

News from Jeol USA (18 January 2008)

Scanning electron microscope is 'portable'

The new CarryScope is described as the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene

News from Jeol USA ( 9 January 2008)

Electron microscopes score three hits at USC

 User application article   University of Southern California (USC) has purchased three electron microscopes from Jeol USA for its new Center of Excellence for Nano-Imaging in Los Angeles, California

News from Jeol USA ( 5 October 2007)

New high-sensitivity NMR spectrometer goes on show

JEOL USA is introducing its new compact, high-performance ECS-400 400MHz NMR spectrometer featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet

News from Jeol USA ( 9 August 2007)

JEOL introduces new high sensitivity FT-NMR

JEOL USA has introduced a new, high-stability FT-NMR spectrometer that is fully automated and network cyber-enabled, adaptable to a many-to-many communication paradigm

News from Jeol USA ( 7 August 2007)

'Super microprobe' installation completed at Nist

 User application article   Jeol JXA-8500F is a unique type of electron microscope with analytical ability said to surpass that of even the most advanced scanning electron microscopes (SEM) available today

News from Jeol USA ( 6 August 2007)

Mass spec applications booklet now in 3rd edition

The AccuTof time-of-flight mass spectrometer provides exact masses and accurate isotopic abundances that can be used to confirm sample composition or determine the elemental composition of unknowns

News from Jeol USA (27 June 2007)

Seventh consecutive Omega award for service

For the seventh consecutive year, Jeol USA has received the Omega NorthFace Scoreboard award in recognition of its commitment to providing exemplary service and exceeding customer expectations

News from Jeol USA (10 May 2007)

Brain imaging in 3D at high resolution

 Technical background article   Researchers at Harvard University's department of molecular and cellular biology have selected Jeol as a partner in a collaborative effort to map the brain using high resolution SEM images

News from Jeol USA (30 April 2007)

Pet food testing method is a 'breakthrough'

 Technical background article   A professor and graduate student in University of the Pacific's chemistry department have developed a new method for determining how to identify foreign substances in pet food

News from Jeol USA (26 April 2007)

Jeol Technics ships 10,000th electron microscope

 User application article   Jeol Technic, one of Jeol USA's design and manufacturing branches in Akashima, Japan, has shipped its 10,000th scanning electron microscope (SEM)

News from Jeol USA (30 March 2007)

Six awards in six years

For the sixth consecutive year, Jeol USA has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations

News from Jeol USA (13 September 2006)

 

Send us a blank email now to get our free regular email newsletter from the Editor
Laboratorytalk news by product category
Laboratorytalk news by date
Laboratorytalk news by manufacturer
Laboratorytalk Home Page


 

Register for the FREE Laboratorytalk email newsletter now! News about Electron microscopy systems and more every issue. Click here for details.