Product category:
Electron microscopy systems
News Release from: Jeol USA | Subject: CarryScope
Edited by the Laboratorytalk Editorial
Team on 09 January 2008
Scanning electron microscope is
'portable'
The new CarryScope is described as the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene
Jeol USA introduces a new mobile scanning electron microscope that can travel or easily be moved to different locations as needed In the research or manufacturing setting, the CarryScope can be transported between the lab, conference room, or office for inspection of products or analysis of research samples
This article was originally published on Laboratorytalk on 30 Mar 2007 at 8.00am (UK)
Related stories
Jeol Technics ships 10,000th electron microscope
Jeol Technic, one of Jeol USA's design and manufacturing branches in Akashima, Japan, has shipped its 10,000th scanning electron microscope (SEM)
The Jeol CarryScope delivers several high resolution performance imaging and analytical capabilities of conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images.
Standard features include 8x to 300,000x imaging and up to 5.0nm resolution.
The CarryScope produces a sharp image that makes it possible to conduct and annotate high precision measurements on sub-micron structures.
The optional eucentric motorised specimen stage holds a specimen up to 150mm in diameter.
Other options include Low Vacuum, EDS compatibility, and multiple live image display, including picture in picture.
A stage navigation system and SmileShot software with smart settings for routine imaging further enhance the capabilities of this small footprint SEM.
Not exactly pocket-sized: the JCM 5700 CarryScope from Jeol.
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