Horiba Jobin Yvon web site, latest news and contact details

Address:
2 Dalston Gardens
Stanmore
HA7 1BQ
UK
Telephone: (UK) +44 20 8204 8142

Listing of all 76 news releases from Horiba Jobin Yvon:

Particle analyser measures exactly what you see

Horiba Jobin Yvon announce the new PSA300 particle size and shape analyser

News from Horiba Jobin Yvon (14 May 2008)

A new concept in Raman imaging

Completing the Labram family of Raman systems, the Xplora is based on a research grade optical microscope offering all the standard imaging options such as polarisation, DIC and phase contrast

News from Horiba Jobin Yvon (13 March 2008)

Affordable and easy-to-use ICP-AES analysis

Horiba Jobin Yvon announces the Activa-S ICP-AES instrument, which offers the laboratory simplicity in a high performance spectrometer that has the high quality optics for which the company is known

News from Horiba Jobin Yvon (12 March 2008)

New XRF method for sample ID and archiving

Slice, the spectral library identification and classification explorer, is designed to archive, query, and compare X-ray spectra, and represents a revolutionary new approach to materials analysis

News from Horiba Jobin Yvon (14 January 2008)

Raman imaging made faster and better

Horiba Jobin Yvon has introduced two new fast Raman scanning technologies, Swift and DuoScan, which it says now make incredibly fast Raman imaging a reality

News from Horiba Jobin Yvon (13 December 2007)

Partica claims widest particle measurement range

LA-950V2 Partica particle size analyser's revolutionary optical system design combined with improved components and a highly refined algorithm provide unmatched accuracy, precision and resolution

News from Horiba Jobin Yvon (27 November 2007)

Particle size analysis more compact and affordable

With a 0.1-600um measurement range, automatic alignment, fast analysis times, high resolution, powerful software, and ease of use, the LA-300 is said to be ideal for today's labs and budgets

News from Horiba Jobin Yvon (11 October 2007)

XRF imaging microscope has 10um resolution

Horiba Jobin Yvon says its XGT-7000 is useful for forensic science, pharmaceutics, materials, engine wear analysis, geology, museums, archaeology, electronics, contaminant ID, and the life sciences

News from Horiba Jobin Yvon ( 3 October 2007)

New CLUE upgrade for SEMs is revealed

The Optical Spectroscopy Division of Horiba Jobin Yvon has introduced a new Cathodoluminescence Universal Extension (CLUE) upgrade for Scanning Electron Microscopes (SEMs)

News from Horiba Jobin Yvon (17 August 2007)

Everyone can become an expert in ICP analysis

Horiba Jobin Yvon presents the Activa-M, for multi-line analysis by ICP-OES, combining superb instrumental performance with unique advanced software tools

News from Horiba Jobin Yvon (10 July 2007)

Multichannel detectors for every occasion

Symphony CCD and InGaAs arrays, Synapse CCD arrays , and Sygnature CCD and PDA ambient temperature linear detectors are compatible with Horiba Jobin Yvon's comprehensive range of spectrometers

News from Horiba Jobin Yvon ( 5 April 2007)

Activa-M wins editors bronze award at Pittcon 2007

A new innovative approach to ICP spectroscopy, offering potentially great benefits to analytical chemists, was rewarded at Pittcon this year

News from Horiba Jobin Yvon ( 3 April 2007)

Try out a spectroscopic ellipsometer for a week

Horiba Jobin Yvon is requesting proposals for a suitable experiment that would make use of the MM-16's capabilities and that can be completed in a week

News from Horiba Jobin Yvon (30 March 2007)

Spectroscopic ellipsometer and Mueller polarimeter

Horiba Jobin Yvon's MM-16 is a spectroscopic ellipsometer for characterisation of film thickness and optical constants for materials such as semiconductors, compounds, alloys and organic thin films

News from Horiba Jobin Yvon ( 3 November 2006)

Ultra pure wavelength tunable light source

Horiba Jobin Yvon's new TLS-HP2 high-power, high-purity light source is the most powerful and purest tunable light source available for detector and materials characterisation

News from Horiba Jobin Yvon ( 1 November 2006)

Spectroscopic reflectometer for large are mapping

With spatial resolution of <2mm the DigiScreen measures film thickness in the range 100nm to several microns with acquisition times of less than one second per point.

News from Horiba Jobin Yvon (28 August 2006)

Imaging spectrometer promises spectral quality

The iHR550 spectrometer offers a unique combination of spectral quality, flexibility, robustness and ease of use that makes it ideal for performing spectral measurements with quality results

News from Horiba Jobin Yvon (25 August 2006)

Small volume accessory for particle size analyser

Mini Flow accessory for the Partica LA-950 laser diffraction particle size analyser has been designed for quick and accurate operations, for high performances without compromise and easy maintenance

News from Horiba Jobin Yvon (24 August 2006)

Glow discharge spectrometer for depth profiling

Horiba Jobin Yvon introduces the GD-Profiler 2 with new high speed electronics that improve the depth resolution to <1nm

News from Horiba Jobin Yvon (24 July 2006)

Spectroscopic ellipsometer measures all the data

Horiba Jobin Yvon introduces the unique MM-16 spectroscopic ellipsometer to its line of metrology tools for the characterisation of a broad range of materials and thin films