Spectroscopic ellipsometer and Mueller polarimeter

Horiba Jobin Yvon's MM-16 is a spectroscopic ellipsometer for characterisation of film thickness and optical constants for materials such as semiconductors, compounds, alloys and organic thin films

The MM-16 has a simple optical configuration using liquid crystals (LCs) as polariser.

Each ellipsometer heads contains two LC modulators, each modulator having two possible polarisation states.

By measuring all possible combinations of states for each modulator (16 measurements total), and with no moving parts during signal acquisition, the MM-16 measures the full polarisation state matrix (Mueller matrix) of a sample in less than two seconds.

This capability allows accurate, simple and easy characterisation of anisotropic and depolarising materials.

The MM-16 detection system includes a high resolution spectrograph coupled to a 2048 pixel CCD all controlled by Horiba Jobin Yvon spectroscopic ellipsometry software, Delta Psi 2.

The MM-16 can measure multiple layer films thickness from a few angstroms to several microns.

Its unique optical set up makes it especially suitable the characterisation of thin films deposited on transparent substrates such as those found in OLED, solar cell, or photovoltaic applications.

The additional Mueller matrix information allows the quantification of the important parameters necessary to characterise liquid crystals displays and coatings accurately.

With the optional addition of a motorised mapping stage the MM-16 is the perfect characterisation tool for display applications.

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