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National Instruments
Please note: More news from National Instruments on the Electronicstalk web site
Address:
Measurement House Newbury Business Park
London Road
RG14 2PS
UK
Telephone: (UK) +44 1635 523545
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Listing of all 148 news releases from National Instruments:
New graphical software delivers performance gains
National Instruments has unveiled LabVIEW 8.5, the latest version of the graphical system design platform for test, control and embedded system development. Brochure available
News from National Instruments ( 9 August 2007)
NIWeek hits lucky 13
NIWeek 2007 has world-renowned presenters including James Truchard, who will explain the latest trends and design approaches to address the needs of engineering around the world in his opening address Brochure available
News from National Instruments (10 May 2007)
Windows Vista is supported by Labview 8.2.1
With Labview 8.2.1 software and compatible NI hardware drivers, engineers now can use Windows Vista as both a development and deployment platform for their test, control and design applications Brochure available
News from National Instruments (19 April 2007)
National Instruments expands academic site license
National Instruments announces an expansion of its popular academic site license to better address the needs of professors, researchers and students in university departments, colleges and campuses Brochure available
News from National Instruments (16 April 2007)
Interactive sound and vibration measurement
Sound and Vibration Measurement Suite 5.0 is the most comprehensive NI collection of analysis and signal processing tools for noise, vibration, harshness (NVH), machine monitoring, and audio test Brochure available
News from National Instruments (13 April 2007)
PCI oscilloscopes extend speed and channel density
National Instruments has PCI versions of two popular high-speed and high-density digitisers/oscilloscopes, extending high-speed offering to 2GS/s and low-cost offering to £330 or euro475 per channel Brochure available
News from National Instruments (29 March 2007)
Infinity Project standardises on Labview
User application article The Infinity Project provides engineering curricula for high school and university classrooms, including industry-standard technology and professional development, in classrooms 34 US states Brochure available
News from National Instruments (22 March 2007)
Simplified measurements with Labview SignalExpress
Interactive Software Delivers Out-of-the-Box Solution for Data Logging, Benchtop Measurements and Academic Instruction Brochure available
News from National Instruments ( 6 March 2007)
19 new I/O modules for CompactDaq
National Instruments has nearly tripled the number of I/O modules available for NI CompactDaq, adding several new key measurements and capabilities to the USB-based modular data acquisition system Brochure available
News from National Instruments ( 6 March 2007)
Multisim 10.0 integrates virtual instrumentation
Multisim 10.0 and Ultiboard 10.0 are latest versions of interactive Spice simulation and circuit analysis software used for schematic capture, interactive simulation, board layout and integrated test Brochure available
News from National Instruments ( 6 March 2007)
CEO elected to US National Academy of Engineering
James Truchard, CEO, president and cofounder of National Instruments was elected to membership in the National Academy of Engineering, the highest honour given in the US engineering profession Brochure available
News from National Instruments (23 February 2007)
Simplified communication to real-time targets
LabWindows/CVI Real-Time takes advantage of network variables to simplify the process of transferring data between real-time and Windows applications Brochure available
News from National Instruments (13 February 2007)
Learn to build PC measurement systems in minutes
National Instruments holds free technical hands-on data acquisition and Labview seminars in 21 locations around UK and Ireland in March and April 2007 Brochure available
News from National Instruments (31 January 2007)
CompactDaq data acquisition system 'best in test'
Editors at Test and Measurement World named the NI CompactDaq USB-based modular data acquisition system a Best in Test winner and a finalist for the Test Product of the Year Brochure available
News from National Instruments (25 January 2007)
Professional development for scientists, engineers
National Instruments UK and Ireland has announced NI Technical Symposium - a free, one-day professional development series for engineers, scientists and technicians Brochure available
News from National Instruments (19 January 2007)
12-inch HMI for Labview touch panel module
For the new TPC-2012, the TPC-2006 and third-party Windows CE HMIs, the Labview touch panel module reduces development time and cost by providing a single integrated, open development environment Brochure available
News from National Instruments (17 January 2007)
Low-cost USB modules for CAN and LIN
New interfaces offer engineers true hardware synchronisation, portability for in-vehicle automotive testing Brochure available
News from National Instruments (15 January 2007)
NI's USB data acquisition range now has 40 devices
National Instruments has announced two new high-performance M Series multifunction data acquisition (DAQ) devices for USB Brochure available
News from National Instruments (12 January 2007)
Low-cost 6.5 digit multimeters for PCI and Express
National Instruments expands its line of digital multimeters (DMMs) with new low-cost 6 1/2-digit DMMs for PCI Express and PCI Brochure available
News from National Instruments (15 December 2006)
Labview offers compatibility with Windows Vista
Technical background article National Instruments says that Labview, the graphical design platform for test, control and embedded system development, as well as other NI software and drivers, will be compatible with Windows Vista Brochure available
News from National Instruments (14 December 2006)
Labview extended to QNX Neutrino operating system
Extending test data mining to entire groups
Flexibility for software-reconfigurable hardware
First PCI Express digital instruments to 200MB/s
Frame grabbers for every major camera standard
Labview drivers for wireless sensor networks
National Instruments reports record revenue
Process model added to machine vision software
Open standard for algorithm development is updated
400% growth leads to new premises for TBG
Developing PXI Express-based synthetic instrument
Among top 50 employers for new college graduates
Low-speed connectivity for automotive applications
SignalExpress extended to new oscilloscopes
Data streaming for RF and communications apps
Increased Labview support for Agilent instruments
Multifunction devices combine safety and accuracy
Chassis lowers entry cost for high-performance PXI
PXI Express modules and high-bandwidth controllers
NI extends oscilloscope offering to 2GS/s
Labview toolkit for Lego Mindstorms NXT
Labview targets communications test
NI reports record quarterly revenue
ECU measurement and calibration toolkit 2.0
Lower test costs with eight-channel oscilloscope
Dean Kamen to deliver keynote at NIWeek 2006
Industry's highest-voltage PXI switch module
Leading NI products now RoHS-compliant
Showcasing technologies for test and design
Elvis now offers USB plug-and-play
Two LabWindows/CVI certified engineers
Driver network now offers more than 5000 drivers
National Instruments one of best UK workplaces
NI releases Labview 8 Student Edition
External Daq devices offer 32 analogue inputs
Experts share embedded design efficiency methods
USB data acquisition is flexible and easy
NI enhances communications test platform
PCI version of highest dynamic range digitiser
Remote monitoring and control via Asp.net
National Instruments makes fellowship appointment
Chassis, controllers increase dedicated bandwidth
NI joins ZigBee alliance for wireless connectivity
Labview embedded design now available for Blackfin
Ajit Gokhale is UK and Ireland managing director
Shortening development of complex control systems
Isolated PCI data acquisition and motion boards
STMicroelectronics engineer wins award
NI hosts Automated Test Summit 2006 in Birmingham
Digitiser named test product of the year
SignalExpress for Tektronix DPO4000 and AFG3000
District sales manager for Scotland and north-east
Virtual instrumentation for power monitoring
30 years of National Instruments and 20 of Labview
Prize for MSc in electronic instrumentation
New NI field sales engineer for East Anglia
Diadem 10.0 enhances test data mining
Flexible-resolution digitiser is a 'best in test'
The next generation of Lego Mindstorms robotics
Linux support extended to more than 200 devices
Europe's first certified TestStand architect
Building FDA-approved medical device test system
Expanded line of PCI Express frame grabbers
Labview and PXI to test Xbox 360 controllers
High-speed, portable instrument control
Plug and play proves popular with Teds
Labview gains distributed intelligence
RoHS-compliant monitoring and control instruments
UK and Ireland's first certified Labview architect
Low cost high speed data acquisition for PC
Laptop controls PXI/CompactPCI system
Industry's first PCI Express multifunction Daq
Signal processing toolkit simplifies analysis
Advancing technical education with Lego
USB devices deliver high-speed data acquisition
Smart data acquisition devices are reconfigurable
Graphical programming for embedded design
Daq devices offer 80 analogue input channels
PACs replace PLCs for advanced centrifuge control
Data acquisition for Linux and Mac OS X
Smallest, most portable measurement device
Speed signal generation by a factor of 300
Triple performance in control applications
Software speeds machine vision
$5 million to enhance technical education
Measurement quality data acquisition at low cost
Download drivers for 4000 instruments
PCI-based 200MS/s 12-bit digitiser
2005 product catalogue has been streamlined
Lowest-cost strain modules for structural test
Expanding student access to virtual instruments
Acquisition board for high-throughput vision
Data acquisition driver for Linux systems
Next generation multifunction data acquisition
First PCI Express-based GPIB controller
Digitiser and arbitrary waveform generator
Measurement software connects design and test
Speed Ansi C development for test and measurement
USB devices offer portable data acquisition
Image acquisition with PXI compatibility
Extending functionality and flexibility
Labview drivers for Agilent chromatographs
Spearheading noise and vibration testing
Machine vision sees more clearly
TEDS Measurement Platform for Smart Sensors
New release extends LabVIEW capability
Alrad to distribute Compact Vision System
First 24-bit input/output PXI module
Plug-and-play and Labview real-time capabilities
Express technology accelerates report generation
Among Fortune top employers - again
2003 comprehensive catalogue now available
Data collection in harsh environments
Analogue output module for high-speed applications
See images better with this board
Dual-channel modules for thermocouple measurement
Flat panel display testing solution
Data acquisition device for 16-bit measurements
Source code tool for instrument firmware
Fastest embedded controllers on the market
Low-cost data acquisition option for laptop users
Signal Conditioning for ICP accelerometers, RTDs
Instrumentation web site ranked in top three
Massive online sensors and automation resource
Audio and vibration measurements now on PXI

