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National Instruments

Please note: More news from National Instruments on the Electronicstalk web site

Address:
Measurement House Newbury Business Park
London Road
RG14 2PS
UK
Telephone: (UK) +44 1635 523545

http://www.ni.com/uk

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Listing of all 148 news releases from National Instruments:

New graphical software delivers performance gains

National Instruments has unveiled LabVIEW 8.5, the latest version of the graphical system design platform for test, control and embedded system development.  Brochure available  

News from National Instruments ( 9 August 2007)

NIWeek hits lucky 13

NIWeek 2007 has world-renowned presenters including James Truchard, who will explain the latest trends and design approaches to address the needs of engineering around the world in his opening address  Brochure available  

News from National Instruments (10 May 2007)

Windows Vista is supported by Labview 8.2.1

With Labview 8.2.1 software and compatible NI hardware drivers, engineers now can use Windows Vista as both a development and deployment platform for their test, control and design applications  Brochure available  

News from National Instruments (19 April 2007)

National Instruments expands academic site license

National Instruments announces an expansion of its popular academic site license to better address the needs of professors, researchers and students in university departments, colleges and campuses  Brochure available  

News from National Instruments (16 April 2007)

Interactive sound and vibration measurement

Sound and Vibration Measurement Suite 5.0 is the most comprehensive NI collection of analysis and signal processing tools for noise, vibration, harshness (NVH), machine monitoring, and audio test  Brochure available  

News from National Instruments (13 April 2007)

PCI oscilloscopes extend speed and channel density

National Instruments has PCI versions of two popular high-speed and high-density digitisers/oscilloscopes, extending high-speed offering to 2GS/s and low-cost offering to £330 or euro475 per channel  Brochure available  

News from National Instruments (29 March 2007)

Infinity Project standardises on Labview

 User application article   The Infinity Project provides engineering curricula for high school and university classrooms, including industry-standard technology and professional development, in classrooms 34 US states  Brochure available  

News from National Instruments (22 March 2007)

Simplified measurements with Labview SignalExpress

Interactive Software Delivers Out-of-the-Box Solution for Data Logging, Benchtop Measurements and Academic Instruction  Brochure available  

News from National Instruments ( 6 March 2007)

19 new I/O modules for CompactDaq

National Instruments has nearly tripled the number of I/O modules available for NI CompactDaq, adding several new key measurements and capabilities to the USB-based modular data acquisition system  Brochure available  

News from National Instruments ( 6 March 2007)

Multisim 10.0 integrates virtual instrumentation

Multisim 10.0 and Ultiboard 10.0 are latest versions of interactive Spice simulation and circuit analysis software used for schematic capture, interactive simulation, board layout and integrated test  Brochure available  

News from National Instruments ( 6 March 2007)

CEO elected to US National Academy of Engineering

James Truchard, CEO, president and cofounder of National Instruments was elected to membership in the National Academy of Engineering, the highest honour given in the US engineering profession  Brochure available  

News from National Instruments (23 February 2007)

Simplified communication to real-time targets

LabWindows/CVI Real-Time takes advantage of network variables to simplify the process of transferring data between real-time and Windows applications  Brochure available  

News from National Instruments (13 February 2007)

Learn to build PC measurement systems in minutes

National Instruments holds free technical hands-on data acquisition and Labview seminars in 21 locations around UK and Ireland in March and April 2007  Brochure available  

News from National Instruments (31 January 2007)

CompactDaq data acquisition system 'best in test'

Editors at Test and Measurement World named the NI CompactDaq USB-based modular data acquisition system a Best in Test winner and a finalist for the Test Product of the Year  Brochure available  

News from National Instruments (25 January 2007)

Professional development for scientists, engineers

National Instruments UK and Ireland has announced NI Technical Symposium - a free, one-day professional development series for engineers, scientists and technicians  Brochure available  

News from National Instruments (19 January 2007)

12-inch HMI for Labview touch panel module

For the new TPC-2012, the TPC-2006 and third-party Windows CE HMIs, the Labview touch panel module reduces development time and cost by providing a single integrated, open development environment  Brochure available  

News from National Instruments (17 January 2007)

Low-cost USB modules for CAN and LIN

New interfaces offer engineers true hardware synchronisation, portability for in-vehicle automotive testing  Brochure available  

News from National Instruments (15 January 2007)

NI's USB data acquisition range now has 40 devices

National Instruments has announced two new high-performance M Series multifunction data acquisition (DAQ) devices for USB  Brochure available  

News from National Instruments (12 January 2007)

Low-cost 6.5 digit multimeters for PCI and Express

National Instruments expands its line of digital multimeters (DMMs) with new low-cost 6 1/2-digit DMMs for PCI Express and PCI  Brochure available  

News from National Instruments (15 December 2006)

Labview offers compatibility with Windows Vista

 Technical background article   National Instruments says that Labview, the graphical design platform for test, control and embedded system development, as well as other NI software and drivers, will be compatible with Windows Vista  Brochure available  

News from National Instruments (14 December 2006)

Labview extended to QNX Neutrino operating system

Extending test data mining to entire groups

Flexibility for software-reconfigurable hardware

First PCI Express digital instruments to 200MB/s

Frame grabbers for every major camera standard

Labview drivers for wireless sensor networks

National Instruments reports record revenue

Process model added to machine vision software

Open standard for algorithm development is updated

400% growth leads to new premises for TBG

Developing PXI Express-based synthetic instrument

Among top 50 employers for new college graduates

Low-speed connectivity for automotive applications

SignalExpress extended to new oscilloscopes

Data streaming for RF and communications apps

Increased Labview support for Agilent instruments

Multifunction devices combine safety and accuracy

Chassis lowers entry cost for high-performance PXI

PXI Express modules and high-bandwidth controllers

NI extends oscilloscope offering to 2GS/s

Labview toolkit for Lego Mindstorms NXT

Labview targets communications test

NI reports record quarterly revenue

ECU measurement and calibration toolkit 2.0

Lower test costs with eight-channel oscilloscope

Dean Kamen to deliver keynote at NIWeek 2006

Industry's highest-voltage PXI switch module

Leading NI products now RoHS-compliant

Showcasing technologies for test and design

Elvis now offers USB plug-and-play

Two LabWindows/CVI certified engineers

Driver network now offers more than 5000 drivers

National Instruments one of best UK workplaces

NI releases Labview 8 Student Edition

External Daq devices offer 32 analogue inputs

Experts share embedded design efficiency methods

USB data acquisition is flexible and easy

NI enhances communications test platform

PCI version of highest dynamic range digitiser

Remote monitoring and control via Asp.net

National Instruments makes fellowship appointment

Chassis, controllers increase dedicated bandwidth

NI joins ZigBee alliance for wireless connectivity

Labview embedded design now available for Blackfin

Ajit Gokhale is UK and Ireland managing director

Shortening development of complex control systems

Isolated PCI data acquisition and motion boards

STMicroelectronics engineer wins award

NI hosts Automated Test Summit 2006 in Birmingham

Digitiser named test product of the year

SignalExpress for Tektronix DPO4000 and AFG3000

District sales manager for Scotland and north-east

Virtual instrumentation for power monitoring

30 years of National Instruments and 20 of Labview

Prize for MSc in electronic instrumentation

New NI field sales engineer for East Anglia

Diadem 10.0 enhances test data mining

Flexible-resolution digitiser is a 'best in test'

The next generation of Lego Mindstorms robotics

Linux support extended to more than 200 devices

Europe's first certified TestStand architect

Building FDA-approved medical device test system

Expanded line of PCI Express frame grabbers

Labview and PXI to test Xbox 360 controllers

High-speed, portable instrument control

Plug and play proves popular with Teds

Labview gains distributed intelligence

RoHS-compliant monitoring and control instruments

UK and Ireland's first certified Labview architect

Low cost high speed data acquisition for PC

Laptop controls PXI/CompactPCI system

Industry's first PCI Express multifunction Daq

Signal processing toolkit simplifies analysis

Advancing technical education with Lego

USB devices deliver high-speed data acquisition

Smart data acquisition devices are reconfigurable

Graphical programming for embedded design

Daq devices offer 80 analogue input channels

PACs replace PLCs for advanced centrifuge control

Data acquisition for Linux and Mac OS X

Smallest, most portable measurement device

Speed signal generation by a factor of 300

Triple performance in control applications

Software speeds machine vision

$5 million to enhance technical education

Measurement quality data acquisition at low cost

Download drivers for 4000 instruments

PCI-based 200MS/s 12-bit digitiser

2005 product catalogue has been streamlined

Evaluate Labview online

Lowest-cost strain modules for structural test

Expanding student access to virtual instruments

Acquisition board for high-throughput vision

Data acquisition driver for Linux systems

Next generation multifunction data acquisition

First PCI Express-based GPIB controller

Digitiser and arbitrary waveform generator

Measurement software connects design and test

Speed Ansi C development for test and measurement

USB devices offer portable data acquisition

Image acquisition with PXI compatibility

Extending functionality and flexibility

Labview drivers for Agilent chromatographs

Spearheading noise and vibration testing

Machine vision sees more clearly

TEDS Measurement Platform for Smart Sensors

New release extends LabVIEW capability

Alrad to distribute Compact Vision System

First 24-bit input/output PXI module

Plug-and-play and Labview real-time capabilities

Express technology accelerates report generation

Among Fortune top employers - again

2003 comprehensive catalogue now available

Data collection in harsh environments

Analogue output module for high-speed applications

See images better with this board

Dual-channel modules for thermocouple measurement

Flat panel display testing solution

Data acquisition device for 16-bit measurements

PXI controllers

Source code tool for instrument firmware

Fastest embedded controllers on the market

Machine vision software

Low-cost data acquisition option for laptop users

Signal Conditioning for ICP accelerometers, RTDs

Instrumentation web site ranked in top three

Massive online sensors and automation resource

Audio and vibration measurements now on PXI

 

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