Product category:
I/O devices
News Release from: National Instruments | Subject: Automated Test Summit 2006
Edited by the Laboratorytalk Editorial
Team on 28 February 2006
NI hosts Automated Test Summit 2006 in
Birmingham
"The Automated Test Summit will provide our attendees with tools and tips to increase measurement productivity, helping them overcome the market pressures they face"
National Instruments announced that it is hosting the Automated Test Summit 2006, a free one-day conference and exhibition taking place at Edgbaston Cricket Ground, Birmingham, UK, on Tuesday 28 March 2006 At this industry event, other leading industry players will join with NI to help attendees learn about emerging trends and techniques in design validation and manufacturing test and see the latest automated test innovations in action
This article was originally published on Laboratorytalk on 27 Mar 2001 at 8.00am (UK)
Related stories
Audio and vibration measurements now on PXI
For the first time on the PXI platform, engineers can make precision audio and vibration measurements - using the National Instruments NI 4472 signal acquisition module
Massive online sensors and automation resource
Engineers and scientists now can join an online community of experts, NI Developer Zone, to help them design and implement measurement and automation systems.
"Over the past two years, the Automated Test Summit in the USA has provided more than a thousand automated test engineers and managers with the opportunity to discuss strategies for optimising test throughput and improving overall quality while minimising cycle times," said Ian Bell, National Instruments UK and Ireland technical marketing manager.
"Based on overwhelmingly positive feedback, we are hosting the Automated Test Summit 2006 in the UK with new technical content, partners and case study presentations that reflect the current issues the industry faces".
The Automated Test Summit 2006 offers attendees the opportunity to learn how leading corporations increase return on investment through improved automated test methods.
Further reading
Low-cost data acquisition option for laptop users
The DAQCard-6024E multifunction I/O device packs the functions and technologies of National Instruments' full-size, low-cost E Series DAQ devices into the PCMCIA form factor
Signal Conditioning for ICP accelerometers, RTDs
National Instruments announces new Signal Conditioning Component modules for frequency-to-voltage conversion, Integrated Circuit Piezoelectric accelerometers and RTDs
Representatives from companies including National Instruments, Tektronix, Virginia Panel, Dowding and Mills, Jtag Technologies, AmFax, Cyth Systems and Electronics Workbench share their expertise on ensuring product quality, choosing platforms for test and improving test throughput with modular software and hardware.
Keynote presentations, technical sessions and case studies address new technologies such as PCI Express, synchronisation and calibration strategies, software autoscheduling and selecting the appropriate bus technology (LAN, USB, GPIB, PCI/PXI) for your system.
Technical session topics include trends and techniques across the development cycle, bridging validation and test with common software technology, incorporating best practices for ensuring product quality, evaluating platforms for performance and reusability, improving test throughput with emerging technologies.
"Engineers are faced with increased pressures to improve design and manufacturing processes, lower development costs and shorten time to market," said Ian Bell.
"The Automated Test Summit will provide our attendees with tools and tips to increase measurement productivity, helping them overcome the market pressures they face. Request a free brochure from National Instruments ...
"This is one of the only events at which automated test and validation engineers can meet with key players in the industry at one time.".
• National Instruments: contact details and other news
• Email this article to a colleague
• Register for the free Laboratorytalk email newsletter
• Laboratorytalk Home Page
Search the Pro-Talk network of sites
