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Product category: I/O devices
News Release from: National Instruments | Subject: M and S series multifunction DAQ
Edited by the Laboratorytalk Editorial Team on 24 August 2006

Multifunction devices combine safety and
accuracy

National Instruments has announced 12 new isolated M and S Series multifunction data acquisition (DAQ) devices which combine safety and accuracy to deliver reliable measurements in any environment

These devices combine the safety of isolation with the high-performance timing, amplification and calibration technologies of existing M Series DAQ devices for increased accuracy Built-in isolation increases the safety of data acquisition devices and eliminates common problems that can ruin measurement accuracy

The new multifunction devices offer 16-bit accuracy, 250kS/s sampling rates, +/-10V or +/-20mA analogue inputs, +/-10V or 0-20mA analogue outputs and 5V TTL/CMOS or 24V digital inputs and outputs.

The new isolated M and S Series devices offer channel-to-channel or bank isolation with 1950VDC/1400Vrms transient withstand for 5s to a PCI bus, which protects expensive equipment, the user and data from hazardous voltage spikes, transient signals and electrical noise.

Isolation works by electrically separating the circuit's front end, where hazardous voltages can exist, from the rest of the data acquisition system.

Isolation is especially important when taking measurements from sensors in the proximity of wall power, large motors, high-voltage switches or other high-voltage lines.

Isolated M and S Series devices also reject common-mode voltages and prevent ground loops from forming, eliminating two common problems for data acquisition system users.

High common-mode voltages can make it impossible to measure the signal in a non-isolated data acquisition system and can even damage the system.

The new isolated M and S Series devices can measure from sensors with the signal plus common-mode voltages of up to 60V.

Ground loops, which occur when there is a difference between the ground voltages of the measurement system and the signal being measured, can result in high currents flowing between the two grounds and can damage equipment and ruin accuracy. Request a free brochure from National Instruments ...

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