Newport announces new Oriel Matrix spectrometer

Multimodal multiplex spectroscopy removes the primary limitation imposed on traditional dispersive instruments - the tradeoff between throughput and resolution - to deliver 12 times more throughput

Newport has introduced what it calls the ideal instrument for measuring of weak, scattering or diffuse sources, such as fluorescence, thin film reflectance and atomic emission - the new Oriel Matrix spectrometer.

This new solution is the first UV-vis MMS (multimodal multiplex spectroscopy) spectrometer.

MMS patent-pending technology removes the primary limitation imposed on traditional dispersive instruments - the tradeoff between throughput and resolution.

As a result, the Oriel Matrix spectrometer delivers 12 times more throughput and SNR than traditional spectrometers, without compromising resolution, says Newport.

"Our new Oriel Matrix Spectrometer is a truly revolutionary instrument".

"Unlike traditional instruments, the slit is replaced with a large aperture mask, which delivers unequalled throughput".

"The superior signal-to-noise ratio and multiplex advantage let our customers measure extremely weak signals in the 190 to 500nm spectral range with a resolution of 0.6nm," said Nancy Fernandes, Newport's Oriel product line manager.

"We believe that this new completely integrated spectroscopy system is an ideal solution for our research and system integrator customers.

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