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Oxford Nanoscience
Address:
Polaron Nanotechnology Division
4-6 Carters Lane
Kiln Farm
MK11 3ER
UK
Telephone: (UK) +44 1204 405576
http://www.oxfordnanoscience.com
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Listing of all 16 news releases from Oxford Nanoscience:
Technical datasheets for 3-dimensional atom probe
Oxford Nanoscience has introduced a series of technical datasheets covering a variety of aspects of 3DAP usage, ranging from sample preparation techniques to technical issues and application examples
News from Oxford Nanoscience (24 March 2006)
MRam manufacturers turning towards laser 3DAP
Developers of magnetoresistive random access memory are taking a interest in the Laser Three Dimensional Atom Probe from Oxford Nanoscience to show atomic level structure in these complex devices
News from Oxford Nanoscience (22 December 2005)
Greater sampling volume for 3D atom probe
Field of view has been increased by approximately 2.5 times compared to previous versions of the instrument, without sacrificing mass resolution
News from Oxford Nanoscience (14 November 2005)
3DAP wins another award
Three-Dimensional Atom Probe (3DAP) from Oxford Nanoscience has been announced as the winner of the product category of the annual Nano 50 Awards, presented by Nanotech Briefs magazine
News from Oxford Nanoscience (25 October 2005)
Scanning atom probe is under development
Technical background article Next-generation instrument, developed through a DTi-funded Link project, will be used to correlate microstructural properties of the thin films with magnetic and transport device-level performance
News from Oxford Nanoscience ( 7 September 2005)
Laser boosts atom probe power
Technology allows the evaporation, counting, identification and spatial location of individual atoms in a semiconductor sample to produce a three-dimensional visualisation of the atomic arrangement
News from Oxford Nanoscience ( 9 May 2005)
Atom probe is highly sensitive
The extremely narrow peaks produced and high signal-to-noise ratio allow accurate chemical analysis of complex alloys
News from Oxford Nanoscience (18 April 2005)
New head for process development and applications
Peter Clifton joins Oxford Nanoscience from Seagate Technology, where he had been responsible for a variety of sensor development and process development projects
News from Oxford Nanoscience (18 February 2005)
First atom probe sale in China
Instrument provides materials scientists with the ability to simultaneously determine the spatial position and chemical identity of individual atoms in conducting materials
News from Oxford Nanoscience (16 December 2004)
Atom probe wins measurement award
The 3DAP was developed in the materials department of Oxford University by Professors Alfred Cerezo and George Smith, and is now available as a commercial instrument
News from Oxford Nanoscience ( 9 December 2004)
Sales of 3D atom probes to Japan
User application article Oxford Nanoscience announces continuing success in the sale of its 3DAP thtree-dimensional atom probes into Japan
News from Oxford Nanoscience (12 October 2004)
Catalysis cell for 3D atom probe
Oxford Nanoscience has announced the availability of a new accessory for the 3DAP three-dimensional atom probe
News from Oxford Nanoscience ( 1 September 2004)
Atom software speeds materials characterisation
The software has a number of new features, including a new routine for the detection of particles or clusters in the sample, which offers an increase in processing speed of up to 100 times
News from Oxford Nanoscience (29 July 2004)
Three-dimensional atom probe on show
Technique provides materials characterisation capabilities with the resolution needed to investigate nanostructured materials in order to understand and control their properties
News from Oxford Nanoscience (28 June 2004)
Nanotechnology boosts company flotation
Three-dimensional atom probe system offers unique materials characterisation capabilities by allowing both visualisation and analysis of materials at the atomic scale
News from Oxford Nanoscience (24 May 2004)
3D imaging at the nanoscale
Three-dimensional atomic probe imaging with chemical identification boosts materials characterisation at the nanoscale level
News from Oxford Nanoscience ( 1 April 2004)
