Analysis of large samples by spectroscopy

Application note describes and illustrates the use of FT-IR imaging system to obtain images and information from a variety of large samples

When measuring the distribution of components throughout a sample, or 'needle in a haystack' applications, where composition and distribution of a contaminant is unknown, a relatively large area must often be examined, to ensure that essential information is not missed.

PerkinElmer's Spectrum Spotlight FT-IR imaging system can be used for sample sizes ranging from very small (less than 100x100µm) to very large (75x45mm).

A recent application note describes and illustrates the use of the Spectrum Spotlight to obtain images and information from a variety of large samples.

A stretch-blow moulded PET bottle was measured in transmission mode through the thickness of the bottle, with no sample preparation.

A defect was identified which could not be seen in visible light.

Tracing the source of contamination on a failed switch contact involved imaging the entire contact, which was approximately 2mm2.

Results confirmed the contamination as a phosphate, which had leeched from a nearby polymer during use.

Spectrum Spotlight's ability to image large samples makes it an extremely powerful analytical tool, helping to minimise the cost of problem solving, improve product quality and reduce time-to-market of new products.

Its patented dual mode detector (Duet), specifically built for spectroscopy, offers both fast IR imaging and single-point IR microscopy analysis.

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