Product category:
Spectroscopy
News Release from: Perkin Elmer LAS (UK) | Subject: Spectrum 400
Edited by the Laboratorytalk Editorial
Team on 06 March 2007
Spectrum 400: superior FT-IR, FT-NIR
measurement
PerkinElmer debuted at Pittcon 2007 an advanced spectroscopy tool combining optimised near-infrared (NIR) and optimised mid-infrared (MIR) spectroscopy in a single, research-grade instrument
The Spectrum 400 features the ability to automatically switch between NIR and MIR measurement modes and dual sampling positions, enabling the user to rapidly change between applications to drive productivity with automatic, push-button ease It will aid in research, method development, analysis and trouble-shooting in a broad range of chemical and material, pharmaceutical and academic applications
This article was originally published on Laboratorytalk on 19 Apr 2002 at 8.00am (UK)
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"The Spectrum 400 was developed in response to customer demand for more flexible, high-performance NIR and MIR testing to enable thorough product and process research," said Simon Wells, molecular spectroscopy business unit manager, PerkinElmer Life and Analytical Sciences.
"The spectrometer offers a high level of sampling and applications versatility to provide more analytical information".
"It incorporates a unique design that is extremely robust, fast and simple to operate".
The Spectrum 400 is offered with an extensive software suite, including PerkinElmer's AssureID software, which guides and trouble-shoots method development and validation and also provides a simple interface for manufacturing analysis.
This results in much faster method development, more robust testing procedures and a high level of confidence in results.
Available for shipment in May 2007, the Spectrum 400 further supports increased product understanding with the ability to be used in conjunction with the recently introduced PerkinElmer Spotlight 400 FT-IR imaging system, enabling MIR, NIR and attenuated total reflectance (ATR) imaging capabilities.
For the first time, customers can measure the large area distribution of components in materials with up to 3u spatial resolution on the same platform used to measure bulk samples.
The Spectrum 400 instrumentation also includes a number of exclusive and patented FT-IR design approaches to increase the quality of data obtained and ensure consistency of measurements over time and between instruments.
These features, which include high-quality optical components and a broad range of sampling options, are carried through the Spectrum 100, 100N and 400 range to ensure that methods and spectra can be easily transferred between research and routine-testing laboratories.
"This instrument's scalability enables smooth analytical roll-out as companies expand globally," Wells noted.
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