Product category:
Spectroscopy
News Release from: Panalytical | Subject: MiniPal 4 Pharma, CubiX Walk-Up
Edited by the Laboratorytalk Editorial
Team on 26 February 2008
New products and new applications in New
Orleans
That's what attendees at this year's Pittcon conference and expo can expect from Panalytical, which describes itself as the world's leading X-ray analysis company
Panalytical's focus on extending the use of X-ray fluorescence (XRF) spectrometry and X-ray diffraction (XRD) in the pharmaceutical industry will see the announcement of MiniPal 4 Pharma and the US launch of CubiX Walk-Up MiniPal 4 Pharma will find applications in materials verification, catalyst residue analysis and detection of contamination, from stainless steel vessels for example
This article was originally published on Laboratorytalk on 7 Aug 2008 at 8.00am (UK)
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CubiX Walk-Up is the first system to bring 'walk-up' functionality to X-ray powder diffraction users.
With a simplified interface for anytime access, CubiX Walk-Up delivers fully automated measurement, analysis and reporting in a multi-disciplinary environment.
In addition, researchers will have the opportunity to talk to Panalytical experts about the latest system updates and software releases.
Scientists from the petrochemical, cement, mining and metals industries will find areas dedicated to the latest XRF, XRD and OES (optical emission spectroscopy) applications in their fields.
As authorised distributor for OBLF in the USA and Brazil, Panalytical will also introduce that company's VeOS spark emission spectrometer at Pittcon.
The system features cutting-edge detector technology that delivers analytical performance equal to established photomultiplier-based systems.
The semiconductor detectors in the VeOS system were specifically developed for emission spectroscopy and are 100 times more light sensitive than others found in similar systems.
VeOS enables versatile, flexible and rapid analysis of all common metallic materials, and offers the possibility to extend analytical capabilities to include more matrices without the need for hardware changes.
The analytical range of the VeOS includes the precise analysis of short wavelength elements such as nitrogen or low carbon.
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