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Product category: Test and calibration instrumentation
News Release from: Rudolph Instruments | Subject: Quartz Rotation Standards
Edited by the Laboratorytalk Editorial Team on 24 August 2006

Quartz rotation standards

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Rudolph Instruments manufactures and certifies a range of rotation standards to meet all the requirements of USP and polarimeter calibration needs

A recalibration service is also provided for those users to meet current regulatory requirements The Quartz Rotation Standards are offered in two angle ranges: Single plates with 15deg rotation and Double plates with <15deg rotation

The double plate is a combination of two plates, one with positive rotation and one with negative rotation.

The two plates can be used singly or together, providing effectively three calibrated values of rotation in one package.

All the plates are provided with calibration certificate stating the rotation value (@20C) and uncertainty, at the three commonly used wavelengths: 546, 589, and 633nm; as well as the Sugar Values of the plate degZ (ISS) @589nm and 880nm, the new standard wavelength for raw sugar polarization.

The certificate also provides the formula for calculating the rotation value at other temperatures, say 25C.

(The temperature variation is rather small; of the order of 0.01deg, for a plate of 15deg rotation value under a temperature change of 5C, from 20 to 25C but may become important in the most accurate measurements).

The Quartz Rotation Standards are also available in two levels of accuracy.

High accuracy series with an accuracy of +/-0.004deg (+/-0.02degZ) @589nm to meet all applicable specifications of Nist as well as Icumsa for planeness, parallelism, purity, and axis error, and their calibration is traceable to NIST.

Economical series with an accuracy of +/-0.02deg (+/-0.06degZ) and provide the same convenience and NIST traceability at an economical price.

The standards are also available in mountings suitable to fit the sample troughs of other commercial polarimeters like PE, Jasco, SR6 etc.

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