Multi-element analysis by X-ray
A
Thermo Fisher Scientific (Elemental Analysis) product story
Edited by the Laboratorytalk editorial team
Feb 28, 2005
Developed to satisfy the analytical needs of laboratories dealing with unpredictable samples, government and military facilities, urban and industrial air quality, and steel mills analysing slags
Thermo Electron announces the launch of the ARL Quant'X, a new X-ray product which utilises an exclusive Peltier cooled Si(Li) detector and unique digital pulse processing (DPP) technology for high-performance, multi-element analysis of environmental and industrial applications, such as air particulates, soil contamination, toxic elements in plastic, and forensic science.
The ARL Quant'X provides the highest performance-price ratio of all other energy dispersive XRF (EDXRF) instruments on the market and ensures unmatched sensitivity and indispensable flexibility to satisfy, for example, RoHS and WEEE regulations, claims Thermo.
It has been primarily developed to satisfy the analytical needs of laboratories dealing with unpredictable samples, government and military facilities, environmental laboratories monitoring urban and industrial air quality, and steel mills analysing slags.
The Quant'X is said to be ideal for non-destructive analysis with sensitivity at single-digit ppm levels for most elements and sample types.
Equipped with exclusive DPP technology, the Quant'X is said to significantly improve throughput compared to conventional analogue pulse processors.
The electrically-cooled Si (Li) detector is now colder than ever and provides complete elemental coverage with no loss in efficiency that plagues the thinner crystals of SDD and PIN detectors.
The software is designed for accuracy and flexibility with a choice of five algorithms plus comprehensive bulk and thin-film FP, thereby enabling unlimited standardless and semi-standardless capability.
The ethernet technology at the core of the ARL Quant'X allows communication with any computer, desktop or laptop, and enables support for Windows XP and beyond.
High-power performance is achieved without traditional nuisance of water cooling, liquid nitrogen or expensive regular maintenance.
Variable beam collimation allows analysis of smaller samples (down to 1mm), while what is said to be the biggest sample chamber available with any XRF system can accommodate various sample handlers including a 10/20-position auto-sampler and special stages.
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