Methodology allows simultaneous identification and quantification of all crystalline and amorphous phases in a sample, as well as the determination of their atomic arrangements and distortions
Bruker AXS has launched its XRD2 solutions for X-ray diffraction (XRD) with two-dimensional detectors.
It says the XRD2 methodology represents a powerful solution for demanding applications in materials research, high-throughput screening, nanotechnology and thin-film research.
Specifically, XRD2 stands for X-ray analysis by means of a two- dimensional detector with large scattering angle coverage.
XRD2 allows simultaneous identification and quantification of all crystalline and amorphous phases in a sample, as well as the determination of their atomic arrangements and distortions with highest speed and highest accuracy.
Combining speed and accuracy without any compromise is the major progress over traditional XRD systems, which are typically optimised for either high speed or high accuracy.
Bruker AXS's XRD2 is described as an advanced technique for natural or man-made materials containing a wide variety of crystallites of different chemistry and size.
These crystallites frequently show preferred orientation and, in addition, their structure may be under mechanical stress.
All these features create a unique fingerprint of the sample, which can be automatically and non-destructively deciphered with XRD2.
Lutz Bruegemann, XRD marketing manager for Bruker AXS, comments: "Our latest XRD2 solutions can now collect quantitative data from weakly diffracting, anisotropic nanomaterials, powders, strongly diffracting single crystals and thin films in short time-resolved snap-shots.
"We are convinced that our new XRD2 solutions will open the door to completely new applications for our customers in materials analysis and research."
