NeoScope microscope delivers improved magnification
Jeol has unveiled the latest NeoScope Scanning Electron Microscope (SEM) with improved design.
The NeoScope is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X - 60,000X.
- Both high and low vacuum operation
- Three selectable accelerating voltages
- Secondary electron and backscattered electron imaging
- A touch screen interface
The NeoScope accommodates samples up to 70mm in diameter and 50mm in thickness. Both conductive and non-conductive samples can be examined. Optional EDS is available for elemental analysis.
This document provides an appraisal of high resolution Scanning Electron Microscopy applied to porous materials.
High performance FE-SEM optimised for sub-nm resolution imaging of any type of sample
Jeol has developed Centurio, an energy dispersive spectrometer (EDS) for ultra-fast and ultra-sensitive collection of X-rays through analysis with its scanning transmission electron microscopes.
The JEM-2800 from Jeol is a 200kV transmission electron microscope that delivers high-throughput nano-analysis for process and quality control of mass-produced semiconductor and materials samples.
Jeol is offering a 'point-and-shoot' navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users.