Zeta potential analysis technology applies Z-NTA
Zeta potential analysis technology
Nanosight's zeta potential analysis technology applies Zeta Potential Nanoparticle Tracking Analysis (Z-NTA) for the particle-by-particle characterisation of surface charge.
Z-NTA is making its public debut in Booth 519 at the US Pittsburgh Conference and Exposition, which is being held in Atlanta, Georgia, until 17 March.
Z-NTA adds the measurement of surface charge to the simultaneous reporting of size, composition (light-scattering intensity), fluorescence and count.
As with NTA, the core of Nanosight's nanoparticle measurement systems, it collects data on a particle-by-particle basis.
Zeta potential is measured particle by particle, simultaneously, for the complete sample population to provide data that is number weighted, rather than intensity weighted.
Size and light scattering intensity are also reported.
Polydisperse and complex suspensions are readily characterised.
No labelling is required, but a fluorescence mode option is available to further differentiate suitable-labelled sub-populations.
All data sets are validated by the real-time observation of particles moving under both electrophoretic and Brownian motion.
Variations in zeta potential with size are analysed, with positively and negatively charged particles being reported separately even when they exist together.
Sub-populations of similar-sized particles of different materials, differentiated by their propensity to scatter light, are separately reported and counted.
As with size distribution measurement, changes in zeta potential distribution with pH, concentration and temperature may be studied.
Similarly, aggregation and flocculation may be studied quantitatively in real time.
Suitable labelling can highlight one sub-population for analysis despite high background noise.
Compact particle measurement system from Nanosight videodownload
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