The new Spectro Xepos is more accurate, flexible and stable than its predecessor and is now available with two hardware configurations
Spectro introduces the latest generation of the Spectro Xepos at the Achema industrial process trade show (Frankfurt, 15-19 May 2006).
Introduced in 1998, the Spectro Xepos performs energy dispersive X-ray fluorescence analysis with polarized excitation (ED-XRF).
The current version achieves lower detection limits and better repeatability than its predecessor and offers additional analytical advantages as well.
New hardware for lower detection limits.
"Our goal for the Xepos was to further lower the already very good detection limits in order to satisfy the long-term analytical requirements suggested by the various standards institutes," comments Dirk Wissmann, Spectro XRF product manager.
"For that reason, the latest version of the Xepos is equipped with a state-of-the-art Si-drift detector and achieves much lower detection limits than its predecessor, especially for the analysis of light elements".
The precision sample plate of the new Xepos is tailor made for laboratory procedures: It possesses twelve positions for samples between 32mm and 40mm in diameter.
This allows laboratory operators to set up the Xepos and place it in automatic analysis mode for safe, unattended operation.
The latest version of Xepos also offers updated software and an easy-to-use and intuitive method wizard that guides users step-by-step through method development.
Among the typical applications for the new generation Spectro Xepos are screening analyses for the limiting values required by RoHS for the electrical and electronics industries.
The Xepos also is well suited for the chemical and petrochemical industries, the examination of ores and concentrates, and analysis of coatings.
By using additional secondary targets, the detection limits for certain elements can be lowered even further.
These lower detection limits make the Xepos suitable for a number of environmental applications that previously had not been accessible to conventional ED-XRF instruments.
