Almsco International will showcase its new Benchtof-dx mass spectrometer at Pittcon 2010, which is due to take place in Orlando, Florida, from 28 February to 5 March.
Unlike conventional technology, the new compact reflectron time-of-flight (TOF) instrument is specifically designed to generate classical electron impact ionisation (EI) spectra for gas chromatography (GC) and comprehensive GCxGC applications.
According to the company, which will be found in Booth 1806/1807 at the event, the Benchtof-dx enhances the benefits of standard TOF mass spectrometers, making it suitable for historically challenging compounds.
The instrument's capability to generate classical spectra enables laboratories with proprietary spectral libraries to harness the benefits of TOF mass spectrometry while maintaining the use of their current library system.
Incorporating new ion optics and electronics, the Benchtof-dx delivers full spectral information at sensitivity normally only associated with Quadrupoles running in selected ion monitoring (SIM) mode.
Almsco claims that the low-cost design means the frequency of routine mass tuning and calibration are better than those of standard Quadrupole systems.
Benchtof-dx is directly compatible with GC analytical systems.
This platform-neutral instrument has been designed to integrate into mass spectrometry data analysis platforms and interface with most GC systems.
This additional advantage removes the learning curve often associated with the implementation of a mass spectrometry system.
With a selectable spectral acquisition rate that exceeds 500 spectra per second, there are no GC or GCxGC separations that the system cannot accommodate, according to the company.
The Benchtof-dx is accompanied by target search software incorporating deconvolution and chemometric analysis to facilitate the rapid screening of known compounds at trace levels.
At Pittcon 2010, Almsco will also present a series of informative technology posters.
Topics will include 'Introducing a New Advanced Data Processing Software for Mass Spectrometry Employing Dynamic Background Compensation, Spectral Deconvolution and Chemometric Data Analysis' and 'The Analysis of Complex Fragrance Samples Using a New High Sensitivity Bench Top Time of Flight Mass Spectrometer, Incorporating Online Dynamic Background Compensation, and Chemometric Data Analysis'.
