Thermo Fisher Scientific will demonstrate its Thermo Scientific Niton handheld X-ray fluorescence (XRF) analysers - suitable for metal alloy verification - at IMTS 2010 on 13-18 September in Chicago.
The company, which will be found in booth E-5242, will exhibit the Niton XL2 Series and the Niton XL3t Series with geometrically optimised large area drift detector (Goldd) technology.
Thermo Scientific Niton analysers can help users instantly regain lost material traceability.
Bob Wopperer, director of marketing and business development for Thermo Scientific Niton analysers, said: 'Our non-destructive analysers can provide a worry-free solution that takes control of metal alloy verification, the recovery of lost traceability, the analysis of finished welds to validate filler material and dilution and the confirmation of finished products - all without damaging samples in any way, which can save both time and additional testing expense.
'Further, our alloy analysers, including our Niton XL2 and Niton XL3t Goldd, provide the at-line, fast, accurate thickness measurement of multi-layered coatings or plating.
'Because they can also measure irregularly shaped samples as well as small-diameter wiring or tubing, there is no longer a need to cut samples for bench-top analysis,' he added.
