Spectrometer enables analysis of bulk materials
Bruker Nano Analyticscontact supplier
M1 Mistral spectrometer
The M1 Mistral u-XRF spectrometer from Bruker Nano can be used to analyse jewellery and alloys, to determine RoHS compliance and to characterise coatings, for example.
It is said to enable the accurate analysis of bulk materials and layers using X-ray fluorescence (XRF) technology.
The instrument allows the user to analyse arbitrarily shaped samples without the need for preparation.
All elements from Z=22 (titanium) and higher can be analysed.
This makes a wide range of materials accessible, such as metals, alloys and metallic layers, including multi-layer systems.
Specimens up to a size of 100 x 100 x 100mm can be placed directly on the sample stage and analysed without further preparation.
As the measurement is contactless, arbitrarily shaped specimens - such as finely wrought jewellery or materials of varying thickness - can be analysed easily.
The M1 Mistral's micro-focus X-ray tubes produce sufficient intensity, even down to spot sizes of 100um, depending on the collimator used.
Together with the video microscope for exact sample positioning, this ensures that measurement takes place at the desired spot.
Additional comfort can be added with the optional computer-controlled stage motorisation and autofocus function.
To read more about the M1 Mistral, click on the link on the right-hand side.
Nanoscale chemical mapping system download
Inspire is a scanning probe based nanoscale characterisation system that extends atomic force microscopy into the chemical regime.
Bruker Corporation has developed the first FTIR spectrometer to cover the complete mid and far Infrared/THz spectral ranges in one step.
Bruker Nano has introduced its Opterra multipoint scanning confocal microscope designed for integration of confocal microscopy and photoactivation for biology applications.
The two instruments are designed for use alongside electron microscopes to enhance its materials characterisation portfolio.
Extreme imaging speed without loss of resolution videodownload
Samuel Lesko, European Applications Lab Manager at Bruker, provides an introduction to the company’s Dimension FastScan atomic force microscope.